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Other Products / Services

We offer a complete product range of Contact Angle Analysis Equipment, Fluorscence Steady State, Semiautomatic Probers, Photon Counting Spectrofluorimeter and Table Top Module

Contact Angle Analysis Equipment

Since the early 90s AST has offered a complete line of contact angle systems ranging from the very basic to the completely automated. Through the VCA Optima series, the analytical technique of contact angle and surface energy has been transformed. This is achieved through the integration of a video imaging system, sophisticated software and precision mechanics. Our VCA systems provide quantitative, user independent, surface related information nearly instantaneously. As a function of the video capability, automatic, precise measurements are just a mouse click away. Real time images and data can easily be viewed, charted, stored for future reference or printed. In addition to our popular VCA Optima series we also offer application specific systems such as the VCA-3000s for wafer surface analysis or the VCA-4600 series for flat panel surface analysis.
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Solar Module Tester

  • Flash Duration 16ms, 10ms, 80ms
  • Current Ranges 20A, 30A
Measures IV characteristics of PV modulesmaximum power, open circuit voltage, short circuit currentat standard test conditions (STC, IEC standard 60904-1)Simulated sunlight spectrally filtered to AM 1, 5 global, using Xenon flashlamps, intensity adjustableSuited for laboratory measurements and integration into production linesTemporal stability and spectrum at STC class A. Spatial uniformity +- 2-3%AM filtering optional
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Fluorscence Steady State

  • Features Time-domain lifetime measurements with picosecond resolution Lifetime measurement range from milliseconds to picoseconds
ChronosBHISS technology combined with Becker & Hickl electronics for precise TCSPC measurements using laser diodes and LEDs.ChronosBH is a time-domain fluorometer with picosecond resolution. Its optical design and automatic instrument control are state-of-the-art for time-resolved fluorometers.Spectra (excitation, emission, synchronous, time-resolved and polarization)Measurements at fixed wavelengths (intensity and polarization)Measurement of kinetics dataTime-resolved measurements (lifetimes and rotational correlation times)
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EDS X-ray Detector

We offer ESD detectors for X-ray microanalysis and high-throughput applications. Because no single component of this analysis is as critical to performance and accuracy as the X-ray detector, we recommend the liquid nitrogen free Thermo UltraDry. Excellent energy resolution : 128eV FWHMLight element detection down to Beryllium on selected modelsHigh count rate > 750, 000 cps (100k cps - SEM)No Liquid Nitrogen, Peltier cooling
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Semiautomatic Probers

Semiautomatic Probers Wafer is manually loadedSoftware Wizard walks operator thru 2-point alignmentDie index setProber automatically steps die to die until completedRepeat process again
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Photon Counting Spectrofluorimeter

ISS offers a complete line of spectrofluorometers for steady-state and time-resolved fluorescence applications, time-resolved confocal microscopy, lifetime imaging and fluorescence correlation spectroscopy. Several components allow the user to assemble a custom-built spectrofluorometer tailored to specific applications. An extensive line of fluorescence accessories that can also be used in other commercial spectrofluorometers complements the ISS spectrofluorometers.
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Dual Channel Spectrometer

ALBA is a dual channel spectrometer that couples a scanning confocal microscope with fluorescence correlation spectroscopy (FCS) measurements optimized for both single-photon and multi-photon excitation. ALBA acquires either in time-mode (the classical way: photons acquired in time intervals are counted) or in photon mode (time delay between one photon and the next one is measured and an histogram is built). A 2-channel data acquisition card receives the data stream from the detectors and passes them on to the computer. Raw data are stored in a data file for further processing. No need anymore to reject an autocorrelation function because of large particles interference. Raw data can be purged from large particles presence and the autocorrelation function can be recalculated.
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Particle Size Analyzer

CPS Disc Centrifuge, Models DC12000, DC18000, DC20000 and DC24000 - the world's fastest, highest resolution, and most sensitive centrifugal sedimentation particle size analyzers. Measure virtually any type of particle, between 0.01 and 50 microns, at 2 to 10 times better resolution than any other particle sizing instrument, regardless of measurement technique. The minimum reportable peak width can be less than 2% of peak diameter.Particle size Calibration Standards - 0.15 micron to 165 microns peak size; distribution widths of +-9% of peak diameter to +-2% of peak diameter.
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Table Top Module

Xenon flashlamp, spectrally filtered to AM 1.5Light intensity 800Wm2 - ca.1100 Wm2No module heating duringmeasurementModule sizes up to 80 cm x 160cm, class AAA During the flash plateau, an electronic load scans the IV characteristic. Special option for high capacity modules, dark measurements or outdoor measurementsMeasurement period ca. 10-80 ms (adjustable for high capacity modules)Correction of data with respect to module temperature, irradiance. Target conditions STC or other desired test conditions
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Raman Spectrophotometer

500mW laser (785nm) coupled to optical fiber to bring the light to the sample and carry it back to the cooled diode array sensors to record the raman spectrum 100-3300cm-1 with the resolution of 4 10cm-1 with high signal to noise ratio. Microscopic attachment available.
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Nanodrop Lithograpghy

  • Droplet size : 100-200 picoliters
Precise dropping of samples at predetermined places, no. of drops (picoliter, 70um size), 5cm X 5cm XY movement, resolution 100nmXYZ stepper motorNumber of drops user selectableMaximum range of travel: 50 mmResolution: 0.1 umStall Load: 50 NMaximum Speed: 4 mm secOrifice side of the jetting device: 60 micron
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Multi Grade Potentiostat System

  • Specifications: 8 Channel Potentiostat GC/Pt/Au/Ag/ITO/Carbon Paste Electrodes Micro/Disposable electrodes/Low volume cell Simultaneous measurements of 8 samples One common ref/counter and 8 different WE
Biosensor study, 8 simultaneous Cyclic Voltammetry measurements. Electrochemical cell with 8 WE, common ref & counter. 8 different electrochemical solution with 8 ITO WE, 8 RE & 8 CE
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Electron Microscope

  • Type Automatic
  • Voltage 220V
  • Driven Type Electricity
  • Warranty 1 Year
  • Eyepieces WF10X, WF15X
  • Vision Angle 5-10Degree
  • Application Science Lab
  • Objective M10x, M20x

The CX-200 SEM is a use full for surface characterization and produces high quality images with 3.0 nm resolution at accelerating voltage, 30kv and working distance, 5mm. Its magnification is 10X to max. 300, 000 X. The CX-200 is an indispensable tool for various application areas in surface analysis. You can get the great images due to its long depth of focus. The CX-200 chose auto mode it use auto stepper motor type, micro drive, 19nm resolution. You can check point & position of a specimen. User Friendly Operation Nano stationTM is the software for CX-200 based on Microsoft Windows XP and graphic user interface. It is carried out with mouse and keyboard by menu selection. It can provide a high resolution images at a short time

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3D Live Cell Imaging Profilometer

Transmission configured DHM is the ideal instrument for life science applications. It provides quantitative phase measurements of living cell cultures.With optical 3-D microscope you can measure 3-D images of organisms & cells, also record a live videoOne can get all the morphological details like height and concentration variations. Combining this instrument with fluorescence Using DHM in conjunction with a fluorescence module enables to combine High Content Screening DHM measurements with reference fluorescence assays, or for single cell analysis after segmentation.
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Optical Profilometer

  • Features Frequency range from Static to 25MHz Measure vertical velocities up to 10 m/s
The Holographic MEMS Analyzer measures 3D vibrations over the full field of view without XYZ scanning. Millions of data points are acquired simultaneously for measurement of 3D vibrations with similar resolution as a laser vibrometer.
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Metrology Thin Film

In the new and fast growing market for nanotechnology and its applications, Nanosurf has committed itself to smart solutions in the area of scanning probe microscopes and positioning devices with nanometre resolution, as well as being a solution provider of new nanotechnological implementations in the future. Miniaturization has been successful in most of the industrial parts and has led to lots of new, innovative solutions. The process of miniaturization has now reached the nanometre range and will therefore inspire new applications and continue to play an important role in industrial development.
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AFM- NAIO System

Entire AFM system in a single deviceIntegrated XY-positioning table, airflow shielding, and vibration isolationTop view camera and side view sample observation built inAll standard operating modes availableNo laser adjustments requiredNo system setup required: just plug into your PC and start the software!
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CVD Furnace System Model Type : MPCNT-Graphene

The system is designed for growing CNT or graphene materials by CVD process. Quenching can be realized by rapidly sliding the hot zoon of the furnace away from the specimen
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Graphene Synthesis Materials

The system is designed for growing CNT or graphene materials by CVD process. Quenching can be realized by rapidly sliding the hot zoon of the furnace away from the specimen
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Nanosurf Nanite

With the Nanosurf Nanite, you can nano-measure hundreds of samples in one day, without having to be present during measurements, and without having to attend specialist nano-training. The Nanite's efficiency will make nano-surface analysis the industry standard.The Nanosurf Nanite's initial draw is its increased efficiency. It allows batch programmable multiple measurements without SPM knowledge, significantly reducing labour cost and training time and delegating routine measurements to technicians. This alone will delight the head of your production department, but perhaps the even greater benefit is the improved morale of your workforce. Liberated of time-consuming repetitive tasks, they can employ their unique skills to maintain your advantage over your competition.
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Fully Automatic Probers

Load a cassette, initiate system and automatically Loads wafer (MH)Aligns wafer (PR)Probes waferReturns wafer to cassette and loads next waferWafersDiced die in waffle packsDiced die on stretch frame
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Wafer System

VCA-3000S 300mm stage VCA-3000S Wafer Surface Analysis Systems are specially design for use in semiconductor wafer processing quality control. The system provides quick and accurate contact anglesurface energy analysis on wafer surface to evaluate adhesion, cleanliness and coatings. The syringe mechanism can be raised for easy loading and unloading eliminating the possibility of wafer damage. Although the system was designed for wafer surface analysis it is also a useful tool for any application that requires a large stage. Samples sizes up to 12"W x 12"L x .75"H can easily be accommodated by this system
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Double Sided Probing Devices

Double Sided Probing Both standard DSP for Emission Microscopy and SDSP (Simultaneous Double Sided Probing) for double sided devices
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Nanosurf EasyScan 2 Modular System

Take a look at the easyScan 2 and discover a practically self-explanatory system that is simple enough to allow you to concentrate on your research without having to waste precious time setting up and reading the manual every time you want to use the system. The modularity of the easyScan 2 series allow it to meet even apparently contradictory needs with a professional and affordable system tailored to your requirements. This makes the easyScan 2 an essential tool for teaching, training, and research in nanotechnology
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Probe Station

Lab Assistant Family 50 mm to 200 mm Designed for University and Commercial R&D CentersSmall footprintUpgrade pathLow cost
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Detectors Unit

Two-channel Acquisition UnitTwo detectors are mounted into the unit. Typically the detectors are Single Photon Counting Avalanche Photodiodes (SPADs), or Photomultiplier tubes (PMTs). Other detectors can be used as well (hybrid PMTs, microchannelplate MCP detectors). The fluorescence light is brought to the unit from the confocal head of the microscope by using a multimode fiber (50-100 m diameter) with FC connector.
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Solar Simulation Systems

Photo Emission Tech., Inc., manufactures and markets solar simulation systems that meet ASTM E927 (Japanese Standard JIS C8912 and European Standard IEC 60904-9) Class A and Class B requirements. These systems can be used for checking Photovoltaic Cell Performance and in any other application where the effect of exposure to sun light needs to studied, such as photochemistry photobiology testing and environmental exposure testing. Five standard systems are available for each class. Systems can be manufactured with three different air mass (AM) filters: AM0, AM1 and AM1.5.
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Flat Panel Display System

The VCA-4600 Series Surface Analysis Systems for Flat Panel Display are specially designed to accommodate different panel sizes in the industry to evaluate surface conditions during manufacturing processes. Contact angle analysis provides a fast and accurate method for detecting cleanliness and coating problems prior to any full scale panel processing.
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VCA-Optima Surface Analysis Systems

The VCA Optima series incorporates lightweight design, easy assembly, the latest Windows standards and user-friendly software to create a contact angle instrument that's accurate and easy to use. VCA-optima systems are suitable for research or quality control in R&D and processing engineering. Systems range from the basic Optima to the fully equipped Optima XE. Features include Dynamic capture capability, Motorized syringe, Surface energy analysis and Pendant drop analysis, to name a few
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UV-Vis-NIR Halogen Light Source

The DH-2000-BAL is the world's only balanced deuterium halogen source. It uses innovative filtering technology to produces smooth spectrum across entire range. This same technology eliminates the alpha deuterium line in the visible region. Using a combination of deuterium and halogen lamps, the DH-2000 is flexible and ideal for measuring a sample that has multiple features in different spectral regions or for analyzing a variety of different samples in your lab.All deuterium sources have an alpha line, a sharp spectral feature centered at 655 nm. This feature and other deuterium lines produce "unbalanced" output in the deuterium and halogen sources. Simply adjusting the integration time of the spectrometer to suppress the alpha line does not solve the problem as the efficiency of the system at UV wavelengths drops significantly, compromising signal-to-noise performance.
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Bio Air AFM Topography

LiquidAir AFM topography with dynamic phase contrast studies, flat cantilevers addition studies, flat cantilever with a hole and vaccum attachment for stick and place cell sorting studies, cantilever with a hole for nanoing and drug delivery applications in the cell, stiffness mapping for cancer studies.
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Flat Corrosion Cell

Flat Corrosion Cell Flat corrosion cell, Pt wire working electrode counter electrode & AgAgCl Refrence electrode
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Offline Electrochemical AFM Stand

Stand for electrode for nanoparticles, deposition, polymerization studies etc. Offline electrochemical AFM stand compatible to nanosurf AFM.
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NPN SS Plate

Flat rectangular metal surface that can be used as electrode and stable up to 1.5 V against SCE. (dimension approximately 1.5 cm x 8 cm).
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Water Splitting Cell

Cell with provision to put counter, reference and ITOFTO(sample).This cell has quartz window, thus light from solar simulator can be shined and experiments can be carried. Specialized cell for doing only photochemical reactions is also available.
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The Nanosurf EasyScan 2 FlexAFM

Nanosurf's renowned "ease of use" has been implemented consistently in the new FlexAFM scan head. The result is the most versatile and flexible AFM ever. Whether you want to operate the FlexAFM in air or in liquid environments, it makes no difference to you as a user. This is true flexibility!
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AV-900 High Power Test System

AeroVironment's AV-900 has the power you need for heavy duty testing. Hybrid trucks, buses and power station building blocks will benefit from using this test station.
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ABC-150 The Weapon Of Choice

The ABC-150 is AeroVironment's most widely used dual-channel, bi-directional power station. In use for over a decade around the world, satisfied customers agree that the ABC-150 IS the Weapon of Choice for testing batteries, fuel cells, vehicles, motors and inverters.
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ABC-170 Expand The Performance Envelope

The ABC-170 has all of the functionality of the ABC-150 plus much more. When you need to sink more power, the ABC-170 will deliver!
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BDS Turnkey Dielectric Spectrometers

This is our high end system for the frequency range from 3 Hz - 20 MHz (12.5 decades) based on the Alpha-A modular measurement system for dielectric, conductivity, electrochemical and impedance spectroscopy with several test interfaces. The sample impedance is directly determined by the phase-sensitive measurement of the sample voltage and current at fixed frequency. In combination with the ZGS active sample cell interface, the standard sample arrangement is a parallel plate capacitor with diameters from 40 mm to 10 mm and a spacing between the plates from 20 mm to 10 m.
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Alpha Single Unit Analyzer

The Alpha analyzer features high quality general purpose dielectric, conductivity, impedance 2 electrode spectroscopy and gain phase measurements. Both analyzers combine a high class precision broadband dielectric material characterization system with a typical impedance analyzer for the low and middle impedance range. This combination makes them unique and easy to use instruments with exceptional overall performance.
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Beta Single Unit Analyzer

The Beta analyzer has the same functionality of Alpha Analyzer, but supports 3 and 4 electrode configurations in addition. Both analyzers combine a high class precision broadband dielectric material characterization system with a typical impedance analyzer for the low and middle impedance range. This combination makes them unique and easy to use instruments with exceptional overall performance. The Beta and Alpha analyzers cover 16 orders of magnitude impedance range, 12, 5 orders of magnitude frequency range and 1m basic phase accuracy in a single instrument. This combination makes them powerful tools for electric analysis instrumentation. As a result, the analyzers can measure the permittivity, conductivity and impedance of nearly all materials or components broadband and over a wide temperature range without changing sample geometry or sample cells.
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IRIS - Inline Hotspot Inspection

Tau Science was the first company to bring a turnkey hotspot inspection system to the market and has built up years of experience delivering solutions to PV manufactures around the world. We continue to lead this field with the second generation product, introduced in 2011, that sets new standards of precision and accuracy at throughputs exceeding 3000 cells per hour.
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Hybrid Laser Launcher

The Hybrid Laser Launcher accommodates one argon-ion laser, two HeNe laser and one laser diode or solid-state laser. For applications requiring the modulation of a light beam, an electro-optics modulator is mounted in the laser launcher.
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XYZ Piezo-stage

The XYZ PZT is an actuated linear nanopositioning stage of exceptional resolution and stability. The 2.6" x 2.6" hole in the stage center is ideal for applications involving transmitted beams, multiple probes or inverted optics. With its large distance of travel and high stability, the PZT is ideal for the most challenging microscopy and positioning applications. The PZT comes complete with position sensitive detectors for closed loop operation.
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XYZ Piezo Controlled Stage

Coverslip are the most common support for samples in microscopy. The picture shows a coverslip mounted on a XYZ piezo stage. Holders (complete of lid) for using the coverslip on a manual stage are available too.
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Microwell Plates

A computer controlled XY stage is available for applications requiring the use of 96- and 384-wellplates; its operations are fully integrated in the VistaVision software. A typical application of the device consists in the sequential FCS measurements of the wellplate. The user includes the well to be measured. The software positions the first well on the laser beam and acquires the measurement; then the second well is brought into position and a second measurement is acquired. The entire operation is fully automated and it does do not require the presence of the operator. Similarly, lifetime measurements on the content of each well can be acquired sequentially and stored.
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Beam Splitter

The polarizer's transmission is maximized for the wavelength range 450 nm to 1100 nm. The extinction ratio is 10, 000:1 at 3 degrees. The polarizer is mounted into a cube on the automated filterwheel (it accommodates up to 4 optical elements) and is selected through the software.The 5050 beam splitter transmits in the range 380-750 nm. The beam splitter is mounted in a cube on the automated filterwheel (it accommodates up to 4 optical elements) and is selected through the software.
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Filter Cubes

  • Country of Origin India
  • Type Filter Accessories
  • Shape Rectangular
  • Thickness 100-150cm
  • Application Air Filtration
  • Weight 100-200gm

The ISS ALBA confocal unit mounts the filter cube for 18 mm filter by Nikon. Such filter cubes are available through ISS or through Chroma Technology (Model 91000). The cube is mounted on the automated filterwheel (it accommodates up to 4 optical elements) and is selected through the software.The Nikon microscope Model TE2000 mounts a 25 mm filter cube (Chroma Model 91020).

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Laser Diodes Laser Launcher

This unit accommodates up to four lasers diodes that can be utilized simultaneously or one at a time. Radio frequency can be injected into the laser launcher for modulation of the lasers intensity up to 500 MHz.
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