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Secunderabad, Telangana, India
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  1. Microscope 7 Products / Services available
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Microscope #564315

Scanning Probe Microscope

Scanning Probe Microscope
Scanning probe microscope (spm)is a branch of microscope that forms images of surfaces using a physical probe that scans the specimen. Spm was founded with the invention of the scanning tunneling microscope in 1981.Technical specifications:maximum z-range: 5 m derive resolution z: 0.07 nmderive resolution xy:0.25 nmmotorized sample movementimaging modes for afm: contact and semi-contact and non-contactmaximum xy-range for stm: 20 mimaging modes for stm: constant current, constant height.Special features:expandable to suit user needsunique priceperformance ratio for research and teachingmechanical stabilityergonomic designeasy maintenance
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High Speed AFM Atomic Force Microscope

High Speed AFM Atomic Force Microscope
We are offering high speed afm atomic force microscope using this instrument structural studies can be conducted.High-speed atomic force microscopy allows paving path towards direct visualization of dynamic structural changes and dynamic processes of functioning biological molecules in physiological solutions. Dynamic molecular events appear detailed in an afm movie, facilitating our understanding of how biological molecules operate to function.The improved time resolution allowed us to image dynamic cellular events.Powerful tool for investigating cellular morphologies and events. Optical device and powerful control.
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Nanovac AFM Atomic Force Microscope

Nanovac AFM Atomic Force Microscope
Tenfold gain of q-factor. By further vacuum pumping, q-factor variations become insignificant and nearly flat variations are observed. The sensitivity gain is especially important for the light forces measuring.vacuum system provides the proper purity of processes. It will be definitely much less dust and particles around and therefore less interference with nano-scanning.there is much less water on the samples surface and in the probe-sample environment so that capillary forces between the probe and the sample are ignorable. This raises the force measurement accuracy that is useful for all different modes of ara research afm.owing to the high vacuum one can carry out investigations in very low temperatures without hoarfrost on the samples surface. Nano-ara software ver 1.01 includes ability to accept hysteresis and nonlinearity enhancement correcting factors nano vac.surface slope compensationuser interface environmentcontrol parameters adjustment.
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Multimode AFM Atomic Force Microscope

Multimode AFM Atomic Force Microscope
We are offering multimode afm atomic force microscope.High bandwidth sensors & high quality nano scannerdifferent data channels including amplitude, phase, topography high sampling rate and digital filtering implementationdisturbance & noise rejection through closed loop operation the main specifications of ara-afm are as follows: range of scanning: 50 mlateral resolution: 1 nmvertical resolution: 0.1 nmlarge scale sample movement: 7mmlaser power: 0.01wphotodiode sensitivity: 18awmicro actuator resolution: 0.6 m
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scanning tunneling microscope

Scanning Tunneling Microscope
A scanning tunneling microscope(stm) is an instrument for imaging surfaces at the atomic level. For an stm, good resolution is considered to be 0.1 nm lateral resolution and 0.01 nm depth resolution. With this resolution, individual atoms within materials are routinely imaged and manipulated. The stm can be used not only in ultra-high vacuum but also in air, water, and various other liquid or gas ambients.Technical specifications:scanning range: 1m maximum z-range: 1mderive resolution z: 0.015 nmderive resolution xy: 0.015 nmimaging modes: constant current (topography, constant height (current)sample size: max 20 mm diameter.Special features:expandable to suit user needsunique priceperformance ratio for research and teachingmechanical stabilityergonomic designeasy maintenance
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atomic force microscope

Atomic Force Microscope
We are offering atomic force microscope.Tight mechanical coupling yields excellent noise performance.integrated with inverted optical microscopes.two independent, xy and closed-loop z scanner.flat and linear xy scan of up to 40 m 40 m with low residual bow.accurate height measurements.less tip wear for prolonged high-quality and high-resolution imaging.minimized sample damage or modification.immunity from parameter-dependent results observed in tapping imaging.easy sample or tip exchange and easy head removal.direct on-axis optics for high resolution optical viewing.back-lash free sample-stage. Sample positioning range of 7 mm in x and y.compatible with both reflection and transmission optical viewing.
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Bio Afm - Atomic Force Microscope

Bio Afm - Atomic Force Microscope
We are offering atomic force microscope.Tight mechanical coupling yields excellent noise performance.integrated with inverted optical microscopes.two independent, xy and closed-loop z scanner.flat and linear xy scan of up to 40 m 40 m with low residual bow.accurate height measurements.less tip wear for prolonged high-quality and high-resolution imaging.minimized sample damage or modification.immunity from parameter-dependent results observed in tapping imaging.easy sample or tip exchange and easy head removal.direct on-axis optics for high resolution optical viewing.back-lash free sample-stage. Sample positioning range of 7 mm in x and y.compatible with both reflection and transmission optical viewing.
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Retailer of Microscope from Secunderabad, Telangana by Royal Life Sciences
Product / Services
Post Buy Requirement
Royal Life Sciences

Royal Life Sciences Secunderabad, Telangana

Secunderabad, Telangana, India
Verified Add Review
Call 08069247148 Ext. 906

Our Product / Services

  1. Microscope 7 Products / Services available
  2. Business Management Consultants 3 Services available
  3. Material Testing Labs & Services 3 Services available

  4. Product Inspection & Quality Checking Services

    2 Services available

  5. Analyzers And Analytical Instruments

    2 Products available

  6. Laboratory Equipments

    2 Products available

  7. Product Analysis Services

    2 Services available

  8. Bioanalytical Services

    1 Products available

  9. Edible Oil

    1 Products available

  10. Spectrophotometers

    1 Products available
  11. Others Products / Services 36 Products / Services available

Microscope #564315

Our offered Product range includes Scanning Probe Microscope, High Speed AFM Atomic Force Microscope, Nanovac AFM Atomic Force Microscope, Multimode AFM Atomic Force Microscope and scanning tunneling microscope.

Scanning Probe Microscope

Scanning Probe Microscope
Scanning probe microscope (spm)is a branch of microscope that forms images of surfaces using a physical probe that scans the specimen. Spm was founded with the invention of the scanning tunneling microscope in 1981.Technical specifications:maximum z-range: 5 m derive resolution z: 0.07 nmderive resolution xy:0.25 nmmotorized sample movementimaging modes for afm: contact and semi-contact and non-contactmaximum xy-range for stm: 20 mimaging modes for stm: constant current, constant height.Special features:expandable to suit user needsunique priceperformance ratio for research and teachingmechanical stabilityergonomic designeasy maintenance
View Complete Details
Ask Latest Price & Details
High Speed AFM Atomic Force Microscope

High Speed AFM Atomic Force Microscope
We are offering high speed afm atomic force microscope using this instrument structural studies can be conducted.High-speed atomic force microscopy allows paving path towards direct visualization of dynamic structural changes and dynamic processes of functioning biological molecules in physiological solutions. Dynamic molecular events appear detailed in an afm movie, facilitating our understanding of how biological molecules operate to function.The improved time resolution allowed us to image dynamic cellular events.Powerful tool for investigating cellular morphologies and events. Optical device and powerful control.
View Complete Details
Ask Latest Price & Details
Nanovac AFM Atomic Force Microscope

Nanovac AFM Atomic Force Microscope
Tenfold gain of q-factor. By further vacuum pumping, q-factor variations become insignificant and nearly flat variations are observed. The sensitivity gain is especially important for the light forces measuring.vacuum system provides the proper purity of processes. It will be definitely much less dust and particles around and therefore less interference with nano-scanning.there is much less water on the samples surface and in the probe-sample environment so that capillary forces between the probe and the sample are ignorable. This raises the force measurement accuracy that is useful for all different modes of ara research afm.owing to the high vacuum one can carry out investigations in very low temperatures without hoarfrost on the samples surface. Nano-ara software ver 1.01 includes ability to accept hysteresis and nonlinearity enhancement correcting factors nano vac.surface slope compensationuser interface environmentcontrol parameters adjustment.
View Complete Details
Ask Latest Price & Details
Multimode AFM Atomic Force Microscope

Multimode AFM Atomic Force Microscope
We are offering multimode afm atomic force microscope.High bandwidth sensors & high quality nano scannerdifferent data channels including amplitude, phase, topography high sampling rate and digital filtering implementationdisturbance & noise rejection through closed loop operation the main specifications of ara-afm are as follows: range of scanning: 50 mlateral resolution: 1 nmvertical resolution: 0.1 nmlarge scale sample movement: 7mmlaser power: 0.01wphotodiode sensitivity: 18awmicro actuator resolution: 0.6 m
View Complete Details
Ask Latest Price & Details
scanning tunneling microscope

Scanning Tunneling Microscope
A scanning tunneling microscope(stm) is an instrument for imaging surfaces at the atomic level. For an stm, good resolution is considered to be 0.1 nm lateral resolution and 0.01 nm depth resolution. With this resolution, individual atoms within materials are routinely imaged and manipulated. The stm can be used not only in ultra-high vacuum but also in air, water, and various other liquid or gas ambients.Technical specifications:scanning range: 1m maximum z-range: 1mderive resolution z: 0.015 nmderive resolution xy: 0.015 nmimaging modes: constant current (topography, constant height (current)sample size: max 20 mm diameter.Special features:expandable to suit user needsunique priceperformance ratio for research and teachingmechanical stabilityergonomic designeasy maintenance
View Complete Details
Ask Latest Price & Details
atomic force microscope

Atomic Force Microscope
We are offering atomic force microscope.Tight mechanical coupling yields excellent noise performance.integrated with inverted optical microscopes.two independent, xy and closed-loop z scanner.flat and linear xy scan of up to 40 m 40 m with low residual bow.accurate height measurements.less tip wear for prolonged high-quality and high-resolution imaging.minimized sample damage or modification.immunity from parameter-dependent results observed in tapping imaging.easy sample or tip exchange and easy head removal.direct on-axis optics for high resolution optical viewing.back-lash free sample-stage. Sample positioning range of 7 mm in x and y.compatible with both reflection and transmission optical viewing.
View Complete Details
Ask Latest Price & Details
Bio Afm - Atomic Force Microscope

Bio Afm - Atomic Force Microscope
We are offering atomic force microscope.Tight mechanical coupling yields excellent noise performance.integrated with inverted optical microscopes.two independent, xy and closed-loop z scanner.flat and linear xy scan of up to 40 m 40 m with low residual bow.accurate height measurements.less tip wear for prolonged high-quality and high-resolution imaging.minimized sample damage or modification.immunity from parameter-dependent results observed in tapping imaging.easy sample or tip exchange and easy head removal.direct on-axis optics for high resolution optical viewing.back-lash free sample-stage. Sample positioning range of 7 mm in x and y.compatible with both reflection and transmission optical viewing.
View Complete Details
Ask Latest Price & Details
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