RB Metrology

Kirti Nagar, Delhi

With ultramodern warehouse and automated warehouse management systems, we carry out excellent supply chain management. This helps us in meeting voluminous requirements. By using quality packing material, we make sure that the products are properly packed and there will be zero damage during transit. Moreover, our packaging experts stringently check the entire lot before making the final dispatch.

With ZEISS Xradia 520 Versa you extend the limits of your exploration : Unlock versatility for your scientific discovery and industrial research with ZEISS Xradia 520 Versa, the most advanced model in the Xradia Versa family. Image non-destructively in 3D with X-rays. Build on industry-best resolution and contrast. Expand the boundaries of non-destructive imaging. Innovative contrast and acquisition techniques free you to seek - and find – what you’ve never seen before.

Benefits in Xradia 520 Versa

• Experience Resolution Beyond Micro-CT - Explore a multitude of lab-based applications, sample types and sizes with ZEISS Xradia 520 Versa. Benefit from extending your research beyond the limits of basic projection-based micro-and nano-CT systems. Achieve images with a spatial resolution of 0.7 µm and minimum achievable voxel of 70 nm.
• Enhance Your Images with Advanced Contrast Techniques - Get images of challenging samples using advanced contrast capabilities like proprietary enhanced absorption contrast or tunable propagation phase contrast.
• Characterize Materials in situ and in 4D : Characterize the 3D microstructure of materials nondestructively. Uniquely work in simulated conditions – in situ – or study the evolution of your samples’ properties over time in 4D.
• The Technology Behind X-ray Optics - Profit from achieving submicron resolution at large working distances, known as Resolution at a Distance (RaaD). Xradia Versa architecture natively uses a two-stage magnification: images are initially enlarged through geometric magnification as they are in conventional micro-CTs. The projected image impinges on a scintillator, which converts X-rays to visible light. Your image is subsequently magnified by an optical objective before reaching the detector. Add the optional flat panel extension (FPX) to your system to further increase its versatility. This combination of detector designs allows you to study a wide range of sample sizes and types efficiently and accurately.

Highlights

• Dual Scan Contrast Visualizer (DSCoVer) - With DSCoVer you take advantage of how X-rays interact with matter based on effective atomic number and density. Probe for features normally indistinguishable in a single scan. Identify, for example, mineralogical differences within rocks and difficult-to-discern materials such as silicon and aluminum. Profit from side-by-side tuning of two distinct tomographies at different imaging and sample conditions. Collect data for dual energy analysis seamlessly and easily with DSCoVer. 
• High-Aspect Ratio Tomography (HART) - Achieve up to 2x higher throughput or better image quality when imaging flat samples such as semiconductor packages and boards. HART enables you to space variable projections so that you collect fewer projections along the broad side of a flat sample and more along the thin side. 3D data is provided by these closely-spaced long views versus less densely-spaced short views.
• Automated Filter Changer (AFC) - Image challenging samples even easier now. Use AFC to complement your DSCoVer and profit from more flexibility for your in situ workflows. Tune your X-ray energy spectrum with source filters enabled by AFC that houses a standard range of 12 filters along with space for a dozen additional custom filters for new applications. Select filters easily and record your selection within imaging recipes so filters may be changed without disrupting your work flow.
• Wide Field Mode (WFM) & Vertical Stitching - Image large samples with an extended lateral field of view or use the standard field of view to achieve higher resolution in a single tomography with the help of WFM. Profit from a bigger lateral field of view: approximately twice as wide as in the standard mode and three times larger for a 3D volume. Using the standard field of view, WFM provides nearly twice the number of voxels. Combine WFM with the existing Vertical Stitching feature and subsequently image large samples that are both wider and taller than the standard field of view usually allows.

Accessories

• Laboratory-based Diffraction Contrast (LabDCT) - Unlock crystallographic information in your lab. Achieve direct visualization of 3D crystallographic grain orientation in a non-destructive tomography environment with the LabDCT advanced imaging module powered with GrainMapper3D software by Xnovo Technology. Diffraction contrast tomography (DCT), previously available only at a limited number of synchrotron X-ray facilities, can become your routine tool for non-destructive 3D grain mapping. Acquire and reconstruct crystallographic information from polycrystalline samples, such as metals and alloys. Combine grain orientation information with microstructural features observed in absorption or phase contrast tomography, e.g. cracks, porosity network, inclusions. Open new possibilities for the characterization of damage, deformation and growth mechanisms related to 3D materials science. Achieve enhanced understanding of the fundamental materials science behind these processes with microscopic imaging features in three dimensions.
• Flat Panel Extension (FPX) - Image even larger samples with high throughput at ZEISS best-in-class image quality. Enhance imaging flexibility and create workflow efficiencies with FPX for industrial and academic research. Rapidly scout large samples to identify a region of interest (ROI). Zoom to image targeted volumes at high resolution. FPX extends the Scout-and-Zoom workflow of Xradia520 Versa. Image the full field of view of samples beyond a 5 inch diameter, like geological cores or intact smartphones, with higher throughput. Combine FPX with Resolution at a Distance (RaaD) and benefit further from high resolution imaging for a variety of samples.
• AUTOLOADER - Increase your sample handling efficiency: with the Autoloader you can set-up queues of imaging jobs across a shift or over a weekend. Receive automatic notification of job completion. Achieve precise and repeatable sample measurements. Benefit from flexibly handling diverse sample types in the same queue. Minimize user interaction in you research or industrial laboratory, industrial process development, service laboratory, or university central imaging laboratory.

Use Our Super Simple Control System to Create Efficient Workflows : All of the features introduced by the Xradia 520 Versa are seamlessly integrated within the Scout-and-Scan Control System, an efficient workflow environment that allows you to easily scout a region of interest and specify scanning parameters. The easy-to-use system is ideal for a central lab-type setting where your users may have a wide variety of experience levels. The interface maintains the flexibility for which Xradia Versa systems are well-regarded, enabling you to set-up scans even more easily. Scout-and-Scan software also offers recipe-based repeatability, which is especially useful for your in situ and 4D research, and enables you to have greater control and efficiency for future work.

New on Version 11:

• Automated Vertical Stitching capability sets a new industry standard for imaging tall samples at the push of a button. Combine Wide Field Mode with Vertical Stitching to join separate tomographies into a large seamless image, significantly expanding your field of view for samples that are both wider and taller.
• New Auto Reference provides you with the ability to move in the Z+ or Z- directions as well as the existing X and Y directions, ideal for imaging high aspect ratio samples such as PC boards.
• Adaptive Motion Compensation is a new method to compensate for sample drift that may during the course of a tomography, such as with soft samples.
• The new Reconstructor Scout-and-Scan application pairs with the versatile Automatic Reconstructor to provide added flexibility for data reconstruction.
• Incorporate color palette and log scaling for better data visualization using the new Enhanced Histogram capability.
• Dual Scan Contrast Visualizer, DSCoVer, on Xradia 520 Versa has been updated with our newly patented dual energy interface to give you precise segmentation of different material types, or different materials with similar densities, with the improved dual energy interface.

Visualization and Analysis Software : ZEISS recommends Dragonfly Pro from Object Research Systems (ORS) - An advanced analysis and visualization software solution for your 3D data acquired by a variety of technologies including X-ray, FIB-SEM, SEM and helium ion microscopy.Formerly Visual SI Advanced, Dragonfly Pro delivers high-definition visualization techniques and industry-leading graphics. Dragonfly Pro supports customization through easy to use Python scripting. Users now have total control of their 3D data post-processing environment and workflows.

Experts' assistance is what makes our packaging reliable and highly durable as well. The packaging material used is certified and experts approved to ensure complete safety. Our payment procedure is not only easy to operate but also guarantee secure transactions. In addition to this, it is featured with multiple options like cash payment, bank account transfer and more.

Versatility even at large working distances - mm to inches from source : Achieve new levels of discovery with ZEISS Xradia 510 Versa 3D X-ray microscopes (XRM), the industry’s premier in situ / 4D solution. Our unique RaaD (resolution at a distance) capability breaks the one micron resolution barrier for samples from mm to cm. Use the instrument's powerful combination of world-leading resolution and contrast with flexible working distances to extend the power of non-destructive imaging in your lab.

True Submicron Spatial Resolution at Millimeters to Inches from Source : Maximize the power of X-ray microscopy (XRM) with Xradia 510 Versa for flexible 3D imaging in a wide range of research environments. Xradia 510 Versa achieves better than 0.7 μm true spatial resolution with minimum achievable voxel size below 70 nm. Experience increased versatility for soft or low Z materials with advanced absorption contrast along with innovative phase contrast to overcome the limitations of traditional computed tomography. Achieve performance beyond micro-CT and extend scientific research past the limits of flat-panel systems. Where traditional tomography relies on a single stage of geometric magnification, Xradia Versa instruments feature a unique two-stage process based on synchrotron-caliber optics with a detection system optimized for resolution, contrast and high resolution at large working distances. With breakthrough ZEISS Resolution at a Distance (RaaD), you can accomplish unprecedented lab-based exploration for a diverse array of applications and sample types. Non-destructive X-ray and flexible multilength scale capabilities enable you to image the same sample across a wide range of magnifications. As the industry's premier 4D / in situ solution, with Xradia Versa you can uniquely characterize the microstructure of materials in their native environments as well as to study the evolution of properties over time. The optional Versa In Situ Kit allows you to optimize set-up, makes operation easy and provides a faster time to results, organizing the facilities that support in situ rigs (such as wiring and plumbing) to enable maximum imaging performance and ease of use.Additionally, the Scout-and-Scan control system enables an efficient workflow environment with recipe-based set-up that makes Xradia 510 Versa easy for users with a wide variety of experience levels.

Applications

• Materials Research - Expand your materials research capabilities, whether visualizing cracks in soft composite materials or measuring porosity in steel, all with a single system. Perform in situ studies by imaging under varying conditions such as tensile, compression, gas, oxidation, wetting and temperature variations. You can also image materials that are incompatible with vacuum and charged particle beams.
• Xradia 510 Versa offers the ability to view into deeply buried microstructures that may be unobservable with 2D surface imaging such as optical microscopy, SEM, and AFM. You have the ability to maintain resolution at a distance for in situ imaging experiments, allowing you to study a wide variety of sample sizes and shapes using various in situ apparatus. Understand the impact of these varying conditions over time with the non-destructive nature of X-ray.
• Raw Materials - Characterize and quantify pore structure and connectivity, understand porosity and permeability, analyze mineral liberation efforts, and study carbon sequestration effectiveness. Perform in situ multiphase fluid flow studies. Experience the most accurate 3D, submicron characterization of microstructural evolution by studying the effects on materials under varying conditions and in 4D (time).
• Life Sciences - Leverage high resolution and high contrast to explore unstained and stained hard and soft tissues. Quantify osteocyte properties for bone morphology, map neural networks, study vasculature, and understand development of bio structures.
• Electronics - Optimize your processes and analyze failures. Use non-destructive submicron imaging of intact packages for defect localization and characterization. Measure buried features in three dimensions. Xradia Versa offer the industry’s highest resolution, non-destructive solution for 3D submicron imaging that complements or replaces physical cross sectioning methods.

Benefits : Xradia Versa architecture uses a two-stage magnification technique to enable you to uniquely achieve resolution at a distance (RaaD). In the first stage, enlarge sample images through geometric magnification as with conventional micro-CT. In the second stage, a scintillator converts X-rays to visible light, which is then optically magnified. Reducing dependence upon geometric magnification enables Xradia Versa instruments to maintain submicron resolution at large working distances. This enables you to study the widest range of sample sizes effectively, including within in situ chambers. Additionally, a variety of optional features extend the benefits achieved by the system’s core architecture.

• Preserve and extend the use of valuable samples with non-destructive 3D imaging
• Achieve the highest resolution at the largest working distance from the source, a prerequisite for in situ and large sample imaging, with the unique Versa microscope design
• Multi-length scale imaging of the same sample across a wide range of magnifications, <0.7 µm true spatial resolution and below 70 nm voxel size
• Industry-leading 4D and in situ capabilities, supporting a wide variety of in situ rigs for submicron imaging of practical sized samples (mm to inches) with weight capability up to 25kg and sample size up to 300mm
• Unique architecture with dual stage magnification enables easy navigation through multiple magnification detector system, continuous operation through automated multiple point tomography and repetitive scanning, and high speed reconstruction
• Advanced absorption and phase contrast for low Z materials and soft tissue
• Scout-and-Scan™ control system for easy-to-use workflow set-up ideal in multi-user environments
• Minimal need for sample preparation
• Optional Versa In Situ Kit organizes the facilities that support environmental chambers (such as wiring and plumbing) to enable maximum imaging performance and ease set-up
• Autoloader option enables you to program and run up to 14 samples at a time to maximize productivity, automate workflows for high volume scanning

Use Our Super Simple Control System to Create Efficient Workflows : All of the features on the Xradia 510 Versa are seamlessly integrated within the Scout-and-Scan Control System, an efficient workflow environment that allows you to easily scout a region of interest and specify scanning parameters. The easy-to-use system is ideal for a central lab-type setting where your users may have a wide variety of experience levels. The interface maintains the flexibility for which Xradia Versa systems are known, enabling you to set-up scans even more easily. Scout-and-Scan software also offers recipe-based repeatability, which is especially useful for your in situ and 4D research, and enables you to have greater control and efficiency for future work.

Visualization and Analysis Software  : ZEISS recommends Dragonfly Pro from Object Research Systems (ORS). An advanced analysis and visualization software solution for your 3D data acquired by a variety of technologies including X-ray, FIB-SEM, SEM and helium ion microscopy.
Formerly Visual SI Advanced, Dragonfly Pro delivers high-definition visualization techniques and industry-leading graphics. Dragonfly Pro supports customization through easy to use Python scripting. Users now have total control of their 3D data post-processing environment and workflows

By using quality packing material, we make sure that the products are properly packed and there will be zero damage during transit. Moreover, our packaging experts stringently check the entire lot before making the final dispatch. We have streamlined inventory system and spacious warehouse that assist us in meeting the voluminous requirements of the clients and that too in the stipulated time span. With the latest facilities, we efficiently ensure year round availability of the products.

Bridge the Gap in Lab-Based Non-Destructive Submicron Microscopy : Xradia 410 Versa bridges the gap between high-performing X-ray microscopes and less powerful computed tomography (CT) systems. Delivering non-destructive 3D imaging with industry best resolution, contrast, and in situ capabilities, Xradia 410 Versa enables you to achieve groundbreaking research for the widest range of sample sizes. Enhance imaging workflows with this powerful, cost-efficient "workhorse" solution, even in diverse lab environments.

Industry-leading 4D and In Situ Capabilities for Flexible Sample Sizes and Types : Xradia 410 Versa X-ray microscope delivers cost-efficient, flexible 3D imaging to enable you to address a wide range of samples and research environments. Non-destructive X-ray imaging preserves and extends the use of your valuable samples over time. The instrument achieves 0.9 μm true spatial resolution with minimum achievable voxel size of 100 nm. Advanced absorption and phase contrast (for soft or low-Z materials) provide you with more versatility to overcome the limitations of traditional computed tomography (CT) approaches.

Xradia Versa solutions extend scientific research beyond the limits of projection-based micro- and nano-CT systems. Where traditional tomography relies on a single stage of geometric magnification, Xradia 410 Versa features a unique two-stage process based on synchrotron-caliber optics. It is easy to use, with flexible contrast. Breakthrough Resolution at a Distance (RaaD) enables you to maintain submicron resolution across a broad spectrum of sample dimensions in native environments and within a wide range of in situ rigs. Non-destructive multi-length scale capabilities allow you to image the same sample across a wide range of magnifications, making it possible to uniquely characterize the evolution of material microstructure properties between sequential treatments (4D) or as they are subjected to simulated environmental conditions (in situ).Additionally, the Scout-and-Scan control system enables an efficient workflow environment with recipe-based set-up that makes Xradia 410 Versa easy for users with a wide variety of experience levels.

Benefits : Xradia Versa architecture uses a two-stage magnification technique to enable you to uniquely achieve resolution at a distance (RaaD). Enlarge sample images through geometric magnification as with conventional micro-CT. In the second stage, a scintillator converts X-rays to visible light, which is then optically magnified. Reducing dependence upon geometric magnification enables Xradia Versa instruments to maintain submicron resolution at large working distances. This enables you to study the widest range of sample sizes effectively, including within in situ chambers.

• Non-destructive 3D imaging to preserve and extend the use of valuable samples
• High spatial resolution down to <0.9 µm and voxel size to 100 nm
• Advanced contrast solutions for low Z materials and soft tissue
• Industry-leading 4D and in situ capabilities for flexible sample sizes and types
• Scout-and-Scan™ control system for easy-to-use workflow set-up, ideal in multi-user environments
• Heavy load sample stage and extended source and detector stage travel
• Minimal need for sample preparation
• Easy navigation through multiple magnification detector system
• Continuous operation through automated multiple point tomography and repetitive scanning
• High speed reconstruction
• Optional Versa In Situ Kit organizes the facilities that support environmental chambers (such as wiring and plumbing) to enable maximum imaging performance and ease set-up while delivering the highest 3D resolution for in situ applications
• Autoloader option enables you to program and run up to 14 samples at a time to maximize productivity, automate workflows for high volume scanning

Applications

• Materials Research - Image and quantify microstructure evolution in 3D and 4D (time-based). RaaD enables resolution to be maintained for imaging within in situ rigs, including sub-interior regions of your samples, across a large variety of material types and sizes.
• Raw Materials - Characterize and quantify porosity and micro rock structures to achieve the most accurate 3D submicron characterization of rock pore network for “digital rock” simulations and in situ multiphase fluid flow studies. Use X-ray vision to understand crack propagation in ceramics, metals and building materials. Perform quantitative, high resolution, three-dimensional microstructural analysis of relatively large samples at high resolution in situ.
• Life Sciences - Characterize specimens in high definition for developmental biology, virtual histology and neural network mapping. High contrast detectors coupled with phase contrast imaging deliver unprecedented cellular-level detail.
• Electronics - Image failures and microstructural detail in 3D, navigate to a location anywhere within intact sample, perform non-destructive virtual cross sections on large boards and advanced 3D packages. Xradia Versa offer the industry’s highest resolution, non-destructive solution for 3D submicron imaging that complements or replaces physical cross sectioning methods.

 
Use Our Super Simple Control System to Create Efficient Workflows : All of the features on the Xradia 410 Versa are seamlessly integrated within the Scout-and-Scan Control System, an efficient workflow environment that allows you to easily scout a region of interest and specify scanning parameters. The easy-to-use system is ideal for a central lab-type setting where your users may have a wide variety of experience levels. The interface maintains the flexibility for which Xradia Versa systems are known, enabling you to set-up scans even more easily. Scout-and-Scan software also offers recipe-based repeatability, which is especially useful for your in situ and 4D research, and enables you to have greater control and efficiency for future work.
 
New on Version 11:

• Automated Vertical Stitching capability sets a new industry standard for imaging tall samples at the push of a button. Combine Wide Field Mode with Vertical Stitching to join separate tomographies into a large seamless image, significantly expanding your field of view for samples that are both wider and taller.
• New Auto Reference provides you with the ability to move in the Z+ or Z- directions as well as the existing X and Y directions, ideal for imaging high aspect ratio samples such as PC boards.
• Adaptive Motion Compensation is a new method to compensate for sample drift that may during the course of a tomography, such as with soft samples.
• The new Reconstructor Scout-and-Scan application pairs with the versatile Automatic Reconstructor to provide added flexibility for data reconstruction.
• The new Enhanced Histogram capability allows you to incorporate color palette and log scaling for better data visualization .

Visualization and Analysis Software : ZEISS recommends Dragonfly Pro from Object Research Systems (ORS). An advanced analysis and visualization software solution for your 3D data acquired by a variety of technologies including X-ray, FIB-SEM, SEM and helium ion microscopy.
Formerly Visual SI Advanced, Dragonfly Pro delivers high-definition visualization techniques and industry-leading graphics. Dragonfly Pro supports customization through easy to use Python scripting. Users now have total control of their 3D data post-processing environment and workflows.

We are here to guide our clients with the secure payment procedures. With us, the customers get convenience to pay through both online and offline payment methods We use premium-packaging materials to safeguard our products from mechanical and environmental conditions. For our patrons, we offer customized packaging solutions as well.

Explore at the speed of science : Achieve spatial resolution down to 50 nm with ZEISS Xradia 810 Ultra X-ray microscope, the highest among lab-based X-ray imaging systems. Experience unparalleled performance and flexibility with the non-destructive 3D imaging that plays a vital role in today’s breakthrough research. The innovative Xradia Ultra architecture, with unique X-ray optics adapted from synchrotron technology, features absorption and phase contrast. Now with energy at 5.4 keV you can increase the throughput of your nanoscale imaging by up to a factor of 10. Achieve even better contrast and image quality for medium to low Z samples with the lower energy of Xradia 810 Ultra. Expect to accomplish advanced in situ and 4D capabilities for studying structural evolution over time and under varying conditions. Extend the limits of exploration with 3D X-ray imaging for materials research, life sciences, natural resources, and diverse industrial applications.


Highest resolution, even higher contrast, faster : ZEISS solutions deliver the world’s only non-destructive 3D X-ray imaging with resolution down to 50 nm in a laboratory instrument. Along with both absorption and Zernike phase contrast, ZEISS Xradia 810 Ultra employs advanced optics adapted from the synchrotron to deliver industry-best resolution and contrast for your research. This innovative instrument enables breakthrough research by adding a critical, non-destructive step to your traditional imaging workflow.
By delivering higher contrast for your studies at 5.4 keV, Xradia 810 Ultra makes high-resolution X-ray imaging viable for a variety of difficult-to-image materials. Optimize your imaging with absorption and phase contrast for a diverse range of materials such as polymers, oxides, composites, fuel cells, geological samples and biological materials. Having pioneered nanoscale X-ray imaging at synchrotrons and prominent lab facilities worldwide, ZEISS XRM deliver ground¬breaking solutions to help put your studies at the forefront of research.
By making nanoscale X-ray imaging an order of magnitude faster, Xradia 810 Ultra optimizes the business case for XRM, whether your work is for science or industry. For central microscopy labs, a faster workflow translates into the ability to allow more users to leverage the instrument in less time, which in turn extends XRM to a broader base of subscribers. Similarly, you can quickly perform and repeat 4D and in situ studies of internal structures, making these techniques viable for many more applications. And if your applications are very targeted, such as digital rock physics used to explore feasibility of oil and gas extraction, Xradia 810 Ultra delivers measurements you can use to characterize critical parameters such as porosity within a matter of hours.

Benefits :

• The highest resolution—down to 50 nanometers—3D X-ray imaging available in a laboratory
• Non-destructive 3D X-ray imaging allows repeated imaging of the same sample to provide you with direct observation of microstructural evolution
• Both absorption and Zernike phase contrast to image a diverse range of materials—medium to low Z, carbonates to shale, tissue to biomechanisms—faster by a factor of 10 at the nanoscale
• Synchrotron-like results in your lab without the researcher’s challenge of limited access to synchrotrons, or for making your synchrotron time more efficient
• Improved economics based on faster image acquisition times to expand the reach of the central microscopy lab to a wider range of researchers
• Switchable field of view from 16 to 65 µm, as best suited to your imaging needs
• Maintain high resolution while imaging of samples within in situ devices
• Automated image alignment for tomographic reconstruction
• Develop, prepare and test your planned synchrotron experiments in your laboratory to make limited availability of synchrotron beam time more efficient
• Now with Scout-and-Scan Control System with an easy workflow-based user interface, ideal for the central imaging lab where users may have a wide variety of experience levels

Applications

• Materials Research - Optimize study and design of functional materials: batteries, fuel cells, catalysts, composites, construction materials. Obtain realistic 3D microstructure data to improve computational models for bottom-up design of materials. Study and predict material properties and nanostructural evolution. Examine materials for porosity, cracks, and phase distribution in hours rather than days. Use 3D mapping for deeper understanding of properties and behaviors: porosity/pore connectivity, fiber orientation, crack propagation, particle size/distribution, delamination. High resolution, non-destructive imaging facilitates 4D and in situ studies, with high contrast for medium to low Z materials.
• Raw Materials - Use nanoscale X-ray microscopy to determine structure of unconventional reservoir rock (carbonate, shale), obtaining parameters for characterization within hours (porosity, permeability) used in flow simulations to optimize extraction. Achieve nanoscale pore structure measurements faster by a factor of 10 for digital rock physics and special core analysis, significantly reducing time to results. Understand geomechanics under load, study the effects of tensile pressure on metals, or analyze ceramics under pressure.
• Life Sciences - Image soft and hard tissue: microtubules in dentin, osteocyte lacunae and canaliculi in bone, bioscaffolds for tissue engineering, nanoparticle agglomerations in organic materials.
• Electronics - Optimize your package development process through nanoscale visualization of semiconductor samples for electronics packaging research and development.

Understand nanostructural changes in 3D under load : ZEISS Xradia Ultra Load Stage uniquely enables in situ nanomechanical testing - compression, tension, indentation - with non-destructive 3D imaging. Study the evolution of interior structures in 3D, under load, down to 50 nm resolution. Understand how deformation events and failure relate to local nanoscale features. Complement existing mechanical testing methods to gain insight into behavior across multiple length scales.

Highlights

• Add in situ nanomechanical testing capabilities to your Xradia Ultra nanoscale 3D X-ray microscope (XRM)
• Acquire 3D tomograms of your sample under load with resolution down to 50 nm
• Perform a variety of nanomechanical tests such as compression, tension, and indentation
• Study a wide range of materials including metals, ceramics, composites, polymers and biomaterials
• Complement your mechanical test results from electron microscopy, microCT and stand-alone test set-ups to understand behavior across multiple length scales: from the atomic level and the nanoscale to the micro and macro scale.
• Available in two models with different force measurement:
  • LS108: 0.8 N maximum force
  • LS190: 9 N maximum force
• Compatible with:
  • ZEISS Xradia 800 Ultra
  • ZEISS Xradia 810 Ultra
  • Xradia UltraXRM-L200
  • Xradia nanoXCT-200

   

How it works : ZEISS Xradia Ultra Load Stage can be easily configured by the user. It comprises a piezomechanical actuator with closed loop position control, a strain gauge force sensor and sets of top and bottom anvils that enable the various modes. The sample is mounted between two anvils and a sensor measures the force on the sample as a function of anvil displacement.

Key applications :  In situ nanomechanical testing is relevant for a broad range of applications covering both engineered and natural materials.Examples include:

• High strength alloys
• Biomaterials / biomechanics
• Coatings
• Building materials
• Fibers / composites
• Foams

Our quality analysis wing comprises deft professionals who conduct strict checks for ensuring zero-defect products. For the convenience of the clients, we issue an invoice to them including the details of the sale transaction as well as indicating the quantities, products as well as agreed price. Thus, we maintain transparency in our dealings and payment procedures.

Synchrotron-like performance in the lab : With the ZEISS Xradia 800 Ultra X-ray microscope, achieve spatial resolution down to 50 nm, the highest among lab-based X-ray imaging systems. With non-destructive 3D imaging playing a vital role in today’s breakthrough research, you will experience unparalleled performance in an ultra-high resolution lab-based system. The innovative Xradia Ultra architecture features absorption and phase contrast imaging modes and X-ray energy of 8 keV, using unique optics adapted from the synchrotron. With Xradia 800 Ultra, expect to accomplish unrivaled in situ and 4D capabilities for studying material evolution over time and extend the limits of X-ray imaging used in materials science, life sciences, natural resources, and diverse industrial applications.

Highlights

• With resolution as fine as 50 nm, Xradia 800 Ultra provides you with insight into microscopic structures and processes previously not accessible with conventional lab-based X-ray technology. Operating with 8 keV X-rays provides excellent penetration and contrast for a wide range of materials, enabling you to observe structures and materials in their natural state.
• ZEISS integrated phase contrast technology employing the Zernike method allows enhanced visibility of grain boundaries and material interfaces when absorption contrast is low, providing you with visibility of ultra- and nano-structures without staining.
• ZEISS Xradia 800 Ultra delivers reliable internal 3D information otherwise only accessible with destructive methods like cross-sectioning. The large working distance and atmospheric sample environment allow you to perform in situ studies with ease.

Benefits

• Non-destructive 3D X-ray imaging allows repeated imaging of the same sample allowing direct observation of microstructural evolution
• High resolution down to 50 nm is maintained for imaging of samples within in situ devices
• Automated image alignment for tomographic reconstruction
• Switchable field-of-view ranging from 15 to 60 µm
• Absorption and Zernike phase contrast imaging modes
• Develop, prepare and test your planned synchrotron experiments in your laboratory to make limited availability of synchrotron beam time more efficient
• Now with Scout-and-Scan Control System with an easy workflow-based user interface, ideal for the central imaging lab where users may have a wide variety of experience levels

Applications

• Materials Research - For advanced materials development: study and predict material properties and evolution. Characterize 3D structures of composite materials, such as fuel cells, polymers and composites. Measure and identify porosity, cracks, phase distribution etc. Material of different densities may be segmented through the use of absorption-contrast imaging.
• Raw Materials - Oil & gas drilling feasibility studies: perform virtual core analysis to reduce time to results. Nanoscale pore structure measurements for geological samples can now be conducted in a few hours compared to traditional core analysis. Perform flow modeling on the nanoscale to complement submicron imaging with the Versa microscope. Understand geomechanics under load, study the effects of tensile pressure on metals, or analyze ceramics under pressure.
• Life Sciences - Xradia 800 Ultra offers the ability to visualize the internal structure of biological specimens, such as bone and soft tissue, with resolution down to 50 nm. It offers superior contrast, nanoscale 3D X-ray imaging for a variety of materials such as polymers for drug delivery, tissue samples, and scaffolds for tissue engineering.
• Electronics - Xradia 800 Ultra offers visualization of semiconductor samples for electronics packaging research and development.

Understand nanostructural changes in 3D under load : ZEISS Xradia Ultra Load Stage uniquely enables in situ nanomechanical testing - compression, tension, indentation - with non-destructive 3D imaging. Study the evolution of interior structures in 3D, under load, down to 50 nm resolution. Understand how deformation events and failure relate to local nanoscale features. Complement existing mechanical testing methods to gain insight into behavior across multiple length scales.

Highlights

• Add in situ nanomechanical testing capabilities to your Xradia Ultra nanoscale 3D X-ray microscope (XRM)
• Acquire 3D tomograms of your sample under load with resolution down to 50 nm
• Perform a variety of nanomechanical tests such as compression, tension, and indentation
• Study a wide range of materials including metals, ceramics, composites, polymers and biomaterials
• Complement your mechanical test results from electron microscopy, microCT and stand-alone test set-ups to understand behavior across multiple length scales: from the atomic level and the nanoscale to the micro and macro scale.
• Available in two models with different force measurement:
  • LS108: 0.8 N maximum force
  • LS190: 9 N maximum force
• Compatible with:
  • ZEISS Xradia 800 Ultra
  • ZEISS Xradia 810 Ultra
  • Xradia UltraXRM-L200
  • Xradia nanoXCT-200

   

How it works : ZEISS Xradia Ultra Load Stage can be easily configured by the user. It comprises a piezomechanical actuator with closed loop position control, a strain gauge force sensor and sets of top and bottom anvils that enable the various modes. The sample is mounted between two anvils and a sensor measures the force on the sample as a function of anvil displacement.

Key applications : In situ nanomechanical testing is relevant for a broad range of applications covering both engineered and natural materials.Examples include:

• High strength alloys
• Biomaterials / biomechanics
• Coatings
• Building materials
• Fibers / composites
• Foams