Our Products
Audio Video System
1 Products availableLaptops, Computers & Mainframes
1 Products availableLaser Instruments
1 Products availableLeading Manufacturer, Supplier & Retailer of Zeiss Xradia 520 Versa 3D X-Ray Microscope, Zeiss Xradia 510 Versa 3D X-Ray Microscope, Zeiss Xradia 410 Versa 3D X-Ray Microscope, Zeiss Xradia 810 Ultra 3D X-Ray Microscope and Zeiss Xradia 800 Ultra 3D X-Ray Microscope.
With ultramodern warehouse and automated warehouse management systems, we carry out excellent supply chain management. This helps us in meeting voluminous requirements. By using quality packing material, we make sure that the products are properly packed and there will be zero damage during transit. Moreover, our packaging experts stringently check the entire lot before making the final dispatch.
With ZEISS Xradia 520 Versa you extend the limits of your exploration : Unlock versatility for your scientific discovery and industrial research with ZEISS Xradia 520 Versa, the most advanced model in the Xradia Versa family. Image non-destructively in 3D with X-rays. Build on industry-best resolution and contrast. Expand the boundaries of non-destructive imaging. Innovative contrast and acquisition techniques free you to seek - and find – what you’ve never seen before.
Benefits in Xradia 520 Versa
Highlights
Accessories
Use Our Super Simple Control System to Create Efficient Workflows : All of the features introduced by the Xradia 520 Versa are seamlessly integrated within the Scout-and-Scan Control System, an efficient workflow environment that allows you to easily scout a region of interest and specify scanning parameters. The easy-to-use system is ideal for a central lab-type setting where your users may have a wide variety of experience levels. The interface maintains the flexibility for which Xradia Versa systems are well-regarded, enabling you to set-up scans even more easily. Scout-and-Scan software also offers recipe-based repeatability, which is especially useful for your in situ and 4D research, and enables you to have greater control and efficiency for future work.
New on Version 11:
Visualization and Analysis Software : ZEISS recommends Dragonfly Pro from Object Research Systems (ORS) - An advanced analysis and visualization software solution for your 3D data acquired by a variety of technologies including X-ray, FIB-SEM, SEM and helium ion microscopy.Formerly Visual SI Advanced, Dragonfly Pro delivers high-definition visualization techniques and industry-leading graphics. Dragonfly Pro supports customization through easy to use Python scripting. Users now have total control of their 3D data post-processing environment and workflows.
Experts' assistance is what makes our packaging reliable and highly durable as well. The packaging material used is certified and experts approved to ensure complete safety. Our payment procedure is not only easy to operate but also guarantee secure transactions. In addition to this, it is featured with multiple options like cash payment, bank account transfer and more.
Versatility even at large working distances - mm to inches from source : Achieve new levels of discovery with ZEISS Xradia 510 Versa 3D X-ray microscopes (XRM), the industry’s premier in situ / 4D solution. Our unique RaaD (resolution at a distance) capability breaks the one micron resolution barrier for samples from mm to cm. Use the instrument's powerful combination of world-leading resolution and contrast with flexible working distances to extend the power of non-destructive imaging in your lab.
True Submicron Spatial Resolution at Millimeters to Inches from Source : Maximize the power of X-ray microscopy (XRM) with Xradia 510 Versa for flexible 3D imaging in a wide range of research environments. Xradia 510 Versa achieves better than 0.7 μm true spatial resolution with minimum achievable voxel size below 70 nm. Experience increased versatility for soft or low Z materials with advanced absorption contrast along with innovative phase contrast to overcome the limitations of traditional computed tomography. Achieve performance beyond micro-CT and extend scientific research past the limits of flat-panel systems. Where traditional tomography relies on a single stage of geometric magnification, Xradia Versa instruments feature a unique two-stage process based on synchrotron-caliber optics with a detection system optimized for resolution, contrast and high resolution at large working distances. With breakthrough ZEISS Resolution at a Distance (RaaD), you can accomplish unprecedented lab-based exploration for a diverse array of applications and sample types. Non-destructive X-ray and flexible multilength scale capabilities enable you to image the same sample across a wide range of magnifications. As the industry's premier 4D / in situ solution, with Xradia Versa you can uniquely characterize the microstructure of materials in their native environments as well as to study the evolution of properties over time. The optional Versa In Situ Kit allows you to optimize set-up, makes operation easy and provides a faster time to results, organizing the facilities that support in situ rigs (such as wiring and plumbing) to enable maximum imaging performance and ease of use.Additionally, the Scout-and-Scan control system enables an efficient workflow environment with recipe-based set-up that makes Xradia 510 Versa easy for users with a wide variety of experience levels.
Applications
Benefits : Xradia Versa architecture uses a two-stage magnification technique to enable you to uniquely achieve resolution at a distance (RaaD). In the first stage, enlarge sample images through geometric magnification as with conventional micro-CT. In the second stage, a scintillator converts X-rays to visible light, which is then optically magnified. Reducing dependence upon geometric magnification enables Xradia Versa instruments to maintain submicron resolution at large working distances. This enables you to study the widest range of sample sizes effectively, including within in situ chambers. Additionally, a variety of optional features extend the benefits achieved by the system’s core architecture.
Use Our Super Simple Control System to Create Efficient Workflows : All of the features on the Xradia 510 Versa are seamlessly integrated within the Scout-and-Scan Control System, an efficient workflow environment that allows you to easily scout a region of interest and specify scanning parameters. The easy-to-use system is ideal for a central lab-type setting where your users may have a wide variety of experience levels. The interface maintains the flexibility for which Xradia Versa systems are known, enabling you to set-up scans even more easily. Scout-and-Scan software also offers recipe-based repeatability, which is especially useful for your in situ and 4D research, and enables you to have greater control and efficiency for future work.
Visualization and Analysis Software : ZEISS recommends Dragonfly Pro from Object Research Systems (ORS). An advanced analysis and visualization software solution for your 3D data acquired by a variety of technologies including X-ray, FIB-SEM, SEM and helium ion microscopy.
Formerly Visual SI Advanced, Dragonfly Pro delivers high-definition visualization techniques and industry-leading graphics. Dragonfly Pro supports customization through easy to use Python scripting. Users now have total control of their 3D data post-processing environment and workflows
By using quality packing material, we make sure that the products are properly packed and there will be zero damage during transit. Moreover, our packaging experts stringently check the entire lot before making the final dispatch. We have streamlined inventory system and spacious warehouse that assist us in meeting the voluminous requirements of the clients and that too in the stipulated time span. With the latest facilities, we efficiently ensure year round availability of the products.
Bridge the Gap in Lab-Based Non-Destructive Submicron Microscopy : Xradia 410 Versa bridges the gap between high-performing X-ray microscopes and less powerful computed tomography (CT) systems. Delivering non-destructive 3D imaging with industry best resolution, contrast, and in situ capabilities, Xradia 410 Versa enables you to achieve groundbreaking research for the widest range of sample sizes. Enhance imaging workflows with this powerful, cost-efficient "workhorse" solution, even in diverse lab environments.
Industry-leading 4D and In Situ Capabilities for Flexible Sample Sizes and Types : Xradia 410 Versa X-ray microscope delivers cost-efficient, flexible 3D imaging to enable you to address a wide range of samples and research environments. Non-destructive X-ray imaging preserves and extends the use of your valuable samples over time. The instrument achieves 0.9 μm true spatial resolution with minimum achievable voxel size of 100 nm. Advanced absorption and phase contrast (for soft or low-Z materials) provide you with more versatility to overcome the limitations of traditional computed tomography (CT) approaches.
Xradia Versa solutions extend scientific research beyond the limits of projection-based micro- and nano-CT systems. Where traditional tomography relies on a single stage of geometric magnification, Xradia 410 Versa features a unique two-stage process based on synchrotron-caliber optics. It is easy to use, with flexible contrast. Breakthrough Resolution at a Distance (RaaD) enables you to maintain submicron resolution across a broad spectrum of sample dimensions in native environments and within a wide range of in situ rigs. Non-destructive multi-length scale capabilities allow you to image the same sample across a wide range of magnifications, making it possible to uniquely characterize the evolution of material microstructure properties between sequential treatments (4D) or as they are subjected to simulated environmental conditions (in situ).Additionally, the Scout-and-Scan control system enables an efficient workflow environment with recipe-based set-up that makes Xradia 410 Versa easy for users with a wide variety of experience levels.
Benefits : Xradia Versa architecture uses a two-stage magnification technique to enable you to uniquely achieve resolution at a distance (RaaD). Enlarge sample images through geometric magnification as with conventional micro-CT. In the second stage, a scintillator converts X-rays to visible light, which is then optically magnified. Reducing dependence upon geometric magnification enables Xradia Versa instruments to maintain submicron resolution at large working distances. This enables you to study the widest range of sample sizes effectively, including within in situ chambers.
Applications
Use Our Super Simple Control System to Create Efficient Workflows : All of the features on the Xradia 410 Versa are seamlessly integrated within the Scout-and-Scan Control System, an efficient workflow environment that allows you to easily scout a region of interest and specify scanning parameters. The easy-to-use system is ideal for a central lab-type setting where your users may have a wide variety of experience levels. The interface maintains the flexibility for which Xradia Versa systems are known, enabling you to set-up scans even more easily. Scout-and-Scan software also offers recipe-based repeatability, which is especially useful for your in situ and 4D research, and enables you to have greater control and efficiency for future work.
New on Version 11:
Visualization and Analysis Software : ZEISS recommends Dragonfly Pro from Object Research Systems (ORS). An advanced analysis and visualization software solution for your 3D data acquired by a variety of technologies including X-ray, FIB-SEM, SEM and helium ion microscopy.
Formerly Visual SI Advanced, Dragonfly Pro delivers high-definition visualization techniques and industry-leading graphics. Dragonfly Pro supports customization through easy to use Python scripting. Users now have total control of their 3D data post-processing environment and workflows.
We are here to guide our clients with the secure payment procedures. With us, the customers get convenience to pay through both online and offline payment methods We use premium-packaging materials to safeguard our products from mechanical and environmental conditions. For our patrons, we offer customized packaging solutions as well.
Explore at the speed of science : Achieve spatial resolution down to 50 nm with ZEISS Xradia 810 Ultra X-ray microscope, the highest among lab-based X-ray imaging systems. Experience unparalleled performance and flexibility with the non-destructive 3D imaging that plays a vital role in today’s breakthrough research. The innovative Xradia Ultra architecture, with unique X-ray optics adapted from synchrotron technology, features absorption and phase contrast. Now with energy at 5.4 keV you can increase the throughput of your nanoscale imaging by up to a factor of 10. Achieve even better contrast and image quality for medium to low Z samples with the lower energy of Xradia 810 Ultra. Expect to accomplish advanced in situ and 4D capabilities for studying structural evolution over time and under varying conditions. Extend the limits of exploration with 3D X-ray imaging for materials research, life sciences, natural resources, and diverse industrial applications.
Highest resolution, even higher contrast, faster : ZEISS solutions deliver the world’s only non-destructive 3D X-ray imaging with resolution down to 50 nm in a laboratory instrument. Along with both absorption and Zernike phase contrast, ZEISS Xradia 810 Ultra employs advanced optics adapted from the synchrotron to deliver industry-best resolution and contrast for your research. This innovative instrument enables breakthrough research by adding a critical, non-destructive step to your traditional imaging workflow.
By delivering higher contrast for your studies at 5.4 keV, Xradia 810 Ultra makes high-resolution X-ray imaging viable for a variety of difficult-to-image materials. Optimize your imaging with absorption and phase contrast for a diverse range of materials such as polymers, oxides, composites, fuel cells, geological samples and biological materials. Having pioneered nanoscale X-ray imaging at synchrotrons and prominent lab facilities worldwide, ZEISS XRM deliver ground¬breaking solutions to help put your studies at the forefront of research.
By making nanoscale X-ray imaging an order of magnitude faster, Xradia 810 Ultra optimizes the business case for XRM, whether your work is for science or industry. For central microscopy labs, a faster workflow translates into the ability to allow more users to leverage the instrument in less time, which in turn extends XRM to a broader base of subscribers. Similarly, you can quickly perform and repeat 4D and in situ studies of internal structures, making these techniques viable for many more applications. And if your applications are very targeted, such as digital rock physics used to explore feasibility of oil and gas extraction, Xradia 810 Ultra delivers measurements you can use to characterize critical parameters such as porosity within a matter of hours.
Benefits :
Applications
Understand nanostructural changes in 3D under load : ZEISS Xradia Ultra Load Stage uniquely enables in situ nanomechanical testing - compression, tension, indentation - with non-destructive 3D imaging. Study the evolution of interior structures in 3D, under load, down to 50 nm resolution. Understand how deformation events and failure relate to local nanoscale features. Complement existing mechanical testing methods to gain insight into behavior across multiple length scales.
Highlights
How it works : ZEISS Xradia Ultra Load Stage can be easily configured by the user. It comprises a piezomechanical actuator with closed loop position control, a strain gauge force sensor and sets of top and bottom anvils that enable the various modes. The sample is mounted between two anvils and a sensor measures the force on the sample as a function of anvil displacement.
Key applications : In situ nanomechanical testing is relevant for a broad range of applications covering both engineered and natural materials.Examples include:
Our quality analysis wing comprises deft professionals who conduct strict checks for ensuring zero-defect products. For the convenience of the clients, we issue an invoice to them including the details of the sale transaction as well as indicating the quantities, products as well as agreed price. Thus, we maintain transparency in our dealings and payment procedures.
Synchrotron-like performance in the lab : With the ZEISS Xradia 800 Ultra X-ray microscope, achieve spatial resolution down to 50 nm, the highest among lab-based X-ray imaging systems. With non-destructive 3D imaging playing a vital role in today’s breakthrough research, you will experience unparalleled performance in an ultra-high resolution lab-based system. The innovative Xradia Ultra architecture features absorption and phase contrast imaging modes and X-ray energy of 8 keV, using unique optics adapted from the synchrotron. With Xradia 800 Ultra, expect to accomplish unrivaled in situ and 4D capabilities for studying material evolution over time and extend the limits of X-ray imaging used in materials science, life sciences, natural resources, and diverse industrial applications.
Highlights
Benefits
Applications
Understand nanostructural changes in 3D under load : ZEISS Xradia Ultra Load Stage uniquely enables in situ nanomechanical testing - compression, tension, indentation - with non-destructive 3D imaging. Study the evolution of interior structures in 3D, under load, down to 50 nm resolution. Understand how deformation events and failure relate to local nanoscale features. Complement existing mechanical testing methods to gain insight into behavior across multiple length scales.
Highlights
How it works : ZEISS Xradia Ultra Load Stage can be easily configured by the user. It comprises a piezomechanical actuator with closed loop position control, a strain gauge force sensor and sets of top and bottom anvils that enable the various modes. The sample is mounted between two anvils and a sensor measures the force on the sample as a function of anvil displacement.
Key applications : In situ nanomechanical testing is relevant for a broad range of applications covering both engineered and natural materials.Examples include: