XDV-U Wafer & Lead Frame Coating Thickness Measurement System

Lead Frame Coating Thickness Measurement gauge for electroplating as well as electroless coatings X-Ray or XDV-µ Fluorescence Tester is accessible in diverse technical specifications. The range of o Lead Frame Coating is used for non-destructive analyses as well as measurements of coating thickness on very tiny components and structures with complex coating systems.
Applications

• Measurements on very tiny flat components as well as structures like contacts, printed circuit boards, or lead frames
• Study of very thin coatings like gold/palladium coatings of 0.1m (0.004 mils)
• Measurement of functional coatings in the semiconductor and electronics industries
• Determination of complex multi-coating systems
• Automated measurements like quality control

General Specification

• Intended use:Energy dispersive x-ray fluorescence measuring instrument (EDXRF) to measure thin coatings and coating systems on very small flat structures.
• Element range:Aluminum Al (13) to Uranium U (92) - up to 24 elements simultaneously.
• Design:Bench-top unit with hood opening upwards and housing with a slot on the side.
• X/Y- and Z-axis electrically driven and programmable
• Motor-driven changeable filters
• Measuring direction:Top down