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Vaiseshika Surface Roughnesas Tester

Listing ID #651494

  • MOQ 1 Piece(s)
  • Brand NameVAISESHIKA
  • Preferred Buyer Location All over the world

We are offering vaiseshika surface roughnesas tester. Description it is compatible with four standards of site to measure surface roughness of various machinery-processed parts, calculate....
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Company Information

  • Member Since 12 Years
  • Nature of Business Manufacturer
  • Year of Establishment 1976

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We are offering vaiseshika surface roughnesas tester. Description
it is compatible with four standards of site to measure surface roughness of various machinery-processed parts, calculate corresponding and clearly display all measurement parameters. When measuring the roughness of a surface, the sensor is placed on the surface and then uniformly slides along the surface by driving the mechanism by the sharp built-in probe. This roughness causes displacement of the probe which results in change of inductive amount of induction coils so as to generate analogue signal, which is in proportion to the surface roughness at output end of phase-sensitive rectifier. The exclusive dsp processes and calculates and then outputs the measurement results on lcd.
Features
multi paramater measurement: ra, rz, rq, rt
highly sophisticated inductance sensor
four wave filtering methods: rc, pc-rc, guass and d-p
built in lithium ion rechargeable battery and control circuit with high capacity
small in size, light in weight and easy to use
can communicate with pc computer for statistics, printing and analyzing by the optional cable and the software for rs232c interface
manual or automatic (5 min delay) shut down.
Specification
display : 4 digit, 10 mm lcd, with blue backlight
parameters : ra, rz
measuring range : ra, rq : 0.005 - 10 micro m 1.00 - 400.00 ouinch
: rz, rt : 0.020 - 100.0 micro m 0.078 - 4000 ouinch
accuracy : not more than 10%; fluctuation of display value;
: not more than 6%
test principle : inductance type
radius of probe pin : 5 micro m
material of probe pin : diamond
dynamo-measurement of probe : 15mn (1.6 gf)
probe angle : 90 deg.
Vertical radius of guiding head : 48 mm
maximum driving stroke : 17.5 mm 0.7 inch
cutoff lenght (i) : 0.25 mm 0.8 mm 2.5 mm optional
evaluation lenght : 1 -- 5 cut off optional
power li-ion battery : rechargeable
dimension : 140 x 57 x 48 mm
net weight : 420 g
for our complete product range please visit our website www.vaiseshika.com


Company Details close-icon

Since 1976, Vaiseshika Electron Devices has been a dynamic leader in the field of test and measuring instruments having specialization in the field of calibration standards. We offer a wide spectrum of reliable instruments pertaining temperature, pressure, force and resistance calibrations; analytical agri-electronics instruments; PC based data acquisition systems/loggers and optical instruments for material structure analysis. During the last 30 years, we have continuously added new instruments in our range of manufacturing.
The state-of-the-art technologies have been incorporated in the production of our instruments. Materials like manganin, ceramic, gold and platinum have been used to enhance the reliability and accuracy of the instruments and sensors employed therein.
Highly qualified management and staff, world-class calibration reference standards and manufacturing facilities at our works at Ambala Cantt, spanning over an area of 50,000 square feet, back our commitment to industry, research and education.
We have established strategic research and development alliances with eminent national research laboratories and universities viz. the Central Scientific Instruments Organization (CSIO) Chandigarh; the National Physical Laboratory (NPL) New Delhi; the Electronics Regional Test Laboratory (ERTL), New Delhi; the Electronics Test and Development Centre (ETDC), Mohali: the Electronics Research and Development Centre (ERDC), Ambala and the Birla Institute of Technology and Science (BITS) Pilani.
The Quality Management System of Vaiseshika Electron Devices is compliant to ISO 9001: 2000 and having accreditation with the Dutch Council for Accreditation, Utrecht, Netherlands.
Vaiseshika Metrology Laboratory has been accredited by the National Accreditation Board for Testing and Calibration Laboratories (NABL), Department of Science & Technology, Government of India, New Delhi. The Vaiseshika Laboratory is compliant to ISO 17025 Standards for DC Volt and DC Resistance electrical parameters. The calibration standards at Vaiseshika are traceable to the National Institute of Standards and Technology, Gaithersburg, (USA); the German Federal Physical and Technical Institution (Germany) and the National Physical Laboratory, New Delhi, (India).
Anil Jain, Ph.D., the President and Praveen Jain, B.E.(Hons.), the Chief Executive steer the management functions in the Company.
  • Nature of Business Manufacturer / Exporter / Supplier
  • Number of Employees 20 - 50
  • Year of Establishment 1976
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Vaiseshika Surface Roughnesas Tester at Best Price in Ambala - ID: 651494
Products / Services
  • Products / Services
  • Companies
  • Buy Leads
Post Buy Requirement

Vaiseshika Surface Roughnesas Tester

Listing ID #651494

  • MOQ 1 Piece(s)
  • Brand NameVAISESHIKA
  • Preferred Buyer Location All over the world

We are offering vaiseshika surface roughnesas tester. Description it is compatible with four standards of site to measure surface roughness of various machinery-processed parts, calculate....
View More Details
Send Enquiry

Company Information

  • Member Since 12 Years
  • Nature of Business Manufacturer
  • Year of Establishment 1976

Ask for more detail from the seller

Contact Supplier

Product Details no_img_icon

We are offering vaiseshika surface roughnesas tester. Description
it is compatible with four standards of site to measure surface roughness of various machinery-processed parts, calculate corresponding and clearly display all measurement parameters. When measuring the roughness of a surface, the sensor is placed on the surface and then uniformly slides along the surface by driving the mechanism by the sharp built-in probe. This roughness causes displacement of the probe which results in change of inductive amount of induction coils so as to generate analogue signal, which is in proportion to the surface roughness at output end of phase-sensitive rectifier. The exclusive dsp processes and calculates and then outputs the measurement results on lcd.
Features
multi paramater measurement: ra, rz, rq, rt
highly sophisticated inductance sensor
four wave filtering methods: rc, pc-rc, guass and d-p
built in lithium ion rechargeable battery and control circuit with high capacity
small in size, light in weight and easy to use
can communicate with pc computer for statistics, printing and analyzing by the optional cable and the software for rs232c interface
manual or automatic (5 min delay) shut down.
Specification
display : 4 digit, 10 mm lcd, with blue backlight
parameters : ra, rz
measuring range : ra, rq : 0.005 - 10 micro m 1.00 - 400.00 ouinch
: rz, rt : 0.020 - 100.0 micro m 0.078 - 4000 ouinch
accuracy : not more than 10%; fluctuation of display value;
: not more than 6%
test principle : inductance type
radius of probe pin : 5 micro m
material of probe pin : diamond
dynamo-measurement of probe : 15mn (1.6 gf)
probe angle : 90 deg.
Vertical radius of guiding head : 48 mm
maximum driving stroke : 17.5 mm 0.7 inch
cutoff lenght (i) : 0.25 mm 0.8 mm 2.5 mm optional
evaluation lenght : 1 -- 5 cut off optional
power li-ion battery : rechargeable
dimension : 140 x 57 x 48 mm
net weight : 420 g
for our complete product range please visit our website www.vaiseshika.com


Company Details close-icon

Since 1976, Vaiseshika Electron Devices has been a dynamic leader in the field of test and measuring instruments having specialization in the field of calibration standards. We offer a wide spectrum of reliable instruments pertaining temperature, pressure, force and resistance calibrations; analytical agri-electronics instruments; PC based data acquisition systems/loggers and optical instruments for material structure analysis. During the last 30 years, we have continuously added new instruments in our range of manufacturing.
The state-of-the-art technologies have been incorporated in the production of our instruments. Materials like manganin, ceramic, gold and platinum have been used to enhance the reliability and accuracy of the instruments and sensors employed therein.
Highly qualified management and staff, world-class calibration reference standards and manufacturing facilities at our works at Ambala Cantt, spanning over an area of 50,000 square feet, back our commitment to industry, research and education.
We have established strategic research and development alliances with eminent national research laboratories and universities viz. the Central Scientific Instruments Organization (CSIO) Chandigarh; the National Physical Laboratory (NPL) New Delhi; the Electronics Regional Test Laboratory (ERTL), New Delhi; the Electronics Test and Development Centre (ETDC), Mohali: the Electronics Research and Development Centre (ERDC), Ambala and the Birla Institute of Technology and Science (BITS) Pilani.
The Quality Management System of Vaiseshika Electron Devices is compliant to ISO 9001: 2000 and having accreditation with the Dutch Council for Accreditation, Utrecht, Netherlands.
Vaiseshika Metrology Laboratory has been accredited by the National Accreditation Board for Testing and Calibration Laboratories (NABL), Department of Science & Technology, Government of India, New Delhi. The Vaiseshika Laboratory is compliant to ISO 17025 Standards for DC Volt and DC Resistance electrical parameters. The calibration standards at Vaiseshika are traceable to the National Institute of Standards and Technology, Gaithersburg, (USA); the German Federal Physical and Technical Institution (Germany) and the National Physical Laboratory, New Delhi, (India).
Anil Jain, Ph.D., the President and Praveen Jain, B.E.(Hons.), the Chief Executive steer the management functions in the Company.
  • Nature of Business Manufacturer / Exporter / Supplier
  • Number of Employees 20 - 50
  • Year of Establishment 1976
Tell us your Buy Requirement to Get Instant Response
Tell us what you need?

Looking for Vaiseshika Surface Roughnesas Tester?

Quantity
Seller Contact Details

Find Seller from near by Cities

Waiting for permission
To search by voice, go to your browser settings and allow access to microphone

Allow microphone access to search with voice