Scanning Probe Microscope

Scanning probe microscope (spm)is a branch of microscope that forms images of surfaces using a physical probe that scans the specimen. Spm was founded with the invention of the scanning tunneling microscope in 1981.
Technical specifications:
maximum z-range: 5 μm
derive resolution z: 0.07 nm
derive resolution xy:0.25 nm
motorized sample movement
imaging modes for afm: contact and semi-contact and non-contact
maximum xy-range for stm: 20 μm
imaging modes for stm: constant current, constant height.
Special features:
expandable to suit user needs
unique priceperformance ratio for research and teaching
mechanical stability
ergonomic design
easy maintenance