RXLr-4 POL Polarizing Microscope is a principal piece of equipment used by the geologists to observe the optical properties of minerals. It has indispensable applications for Petrography, Crystallography, Geology, Mineralogy, Ceramics, Toxicology, Chemical Microscopy or detecting defects in semiconductors or finding stress points in metal, glass, textiles, etc. It permits orthoscopically or conoscopically to examine and identify the structures and characteristic of material with highly resolved distinctive images under various magnifications. Compact ball-bearing rotating stage,

140mm diameter, graduated with vernier, lock and stage specimen clips. Compensator : Gyps 1l (1st order red compensating plate, 560 nanometers) Mica 1/4l (145 nanometers) and Quartz Wedge (I-IV order) Built-in focussable Bertrand lens with center adjustable. Built-in analyzer removable from optical path. Analyzer can be rotated thro 90° with a vernier reading to 6'. Compensator 1l, 1/4l. Quartz Wedge can be inserted in the tube as per requirement. Fully rotatable Polarizer on a strain free N.A. 1.25 abbe condenser with iris-diaphragm.
Nosepiece - centreable on roller bearing.
Illuminator - Koehler's illuminator with pre-centred 30W tungsten halogen source and integral electric transformer with intensity control is concealed inside the base. Input voltage 220 or 110 Volts.Supplied complete in a box with following optical combination.
Objectives - PF 4x / 0.10, PF 10x / 0.25 and PF 40x / 0.65 SL RFI.
Eyepieces - HKW 10X (Paired) and WF 10x Cross.
RXLr-4POLT Polarizing Microscope alongwith incident illumination : It has the same features as that of RXLr-4POL with additional incident illumination of either 12V/50W or 12V/100W.

RXLr-4 POL Polarizing Microscope is a principal piece of equipment used by the geologists to observe the optical properties of minerals. It has indispensable applications for Petrography, Crystallography, Geology, Mineralogy, Ceramics, Toxicology, Chemical Microscopy or detecting defects in semiconductors or finding stress points in metal, glass, textiles, etc. It permits orthoscopically or conoscopically to examine and identify the structures and characteristic of material with highly resolved distinctive images under various magnifications. Compact ball-bearing rotating stage,

140mm diameter, graduated with vernier, lock and stage specimen clips. Compensator : Gyps 1l (1st order red compensating plate, 560 nanometers) Mica 1/4l (145 nanometers) and Quartz Wedge (I-IV order) Built-in focussable Bertrand lens with center adjustable. Built-in analyzer removable from optical path. Analyzer can be rotated thro 90° with a vernier reading to 6'. Compensator 1l, 1/4l. Quartz Wedge can be inserted in the tube as per requirement. Fully rotatable Polarizer on a strain free N.A. 1.25 abbe condenser with iris-diaphragm.
Nosepiece - centreable on roller bearing.
Illuminator - Koehler's illuminator with pre-centred 30W tungsten halogen source and integral electric transformer with intensity control is concealed inside the base. Input voltage 220 or 110 Volts.Supplied complete in a box with following optical combination.
Objectives - PF 4x / 0.10, PF 10x / 0.25 and PF 40x / 0.65 SL RFI.
Eyepieces - HKW 10X (Paired) and WF 10x Cross.
RXLr-4POLT Polarizing Microscope alongwith incident illumination : It has the same features as that of RXLr-4POL with additional incident illumination of either 12V/50W or 12V/100W.