Laser Scanning Microscope

Listing ID #3334394

The LEXT OLS4100 is a Laser Scanning Microscope to perform non-contact 3D observations and measurements of surface features at 10 nanometer resolutions. The system also features a fast image acquisition and a high-resolution image over a wider area. total magnification: 108x-17.280x height measurement repeatability: 50x: σn-1=0.012 μm height measurement accuracy: 0.2+L100 μm or Less (L= measuring length) planar measurement repeatability: 100x 3σn-1=0.02 μm planar measurement accuracy: measurement value ±2% display resolution: 1nm