The LBA 300 3D is designed and built especially to inspect multicrystalline silicon bricks for PV wafer production.
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Detailed Specs
– Reliable detection of microcracks and SiC inclusions – Reduction of wire breakage by wafering – Increase of wafer yield – Quick cycle time – Loading manually or automatically (in-line) – 3D brick model – Analyzing of ingot crystallization result
Tesscorn was founded in 1993. The company has built its reputation as a leading supplier of top quality instrumentation for institutions in the Semiconductor, Solar and Nanotechnology manufacturing and research sectors. Over the years we have developed a network of suppliers, all leaders in their fields, providing unique manufacturing and research technologies across a broad spectrum of Semiconductor, Solar and Nanotechnology related applications. Our long-time and well established presence in these fields makes us a reliable technology partner and consultant. We pride ourselves on the valuable relationships we have developed with our research and industrial customers over many years.
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