Film Thickness Measurement System

Listing ID #3694464

We developed, in cooperation with leading manufacturers, a wide range of optical thin-film metrology instruments from high-precision sophisticated ellipsometry and reflectometry systems (spectroscopic, fast single wavelength and Imaging) for research and production applications to low-budget reflectometers for variety of applications, Ellipsometry is a nondestructive and highly sensitive optical measurement technique used to analyze thin-layer stacks.