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    ELECTRON PROBE MICRO ANALYZER

    • Supply TypeManufacturer, Exporter, Supplier, Retailer
    • Preferred Buyer Location All over the world

    High brightness Schottky electron source (ie. Field Emission or FE) 3nm - highest Secondary Electron Image resolution for an EPMA Ultra high sensitivity analysis Ultra high resolution mapping Chemical State Analysis Wavelength Dispersive X-Ray (WDX) Spectrometer Secondary Electron Imaging Backscatter Electron Imaging Optical Microscope Imaging Mapping Magnification 400,000x Cathode-Luminescence attachment
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    Company Information

    • calendar Member Since 14 Years
    • building Nature of Business Retailer
    • Year of Establishment 1997

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