High brightness Schottky electron source (ie. Field Emission or FE) 3nm - highest Secondary Electron Image resolution for an EPMA Ultra high sensitivity analysis Ultra high resolution mapping Chemical State Analysis Wavelength Dispersive X-Ray (WDX) Spectrometer Secondary Electron Imaging Backscatter Electron Imaging Optical Microscope Imaging Mapping Magnification 400,000x Cathode-Luminescence attachment