- Accelerationup to 80 g
- Pulse duration6ms / 11 / 18 ms
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Supply Type
Manufacturer, Supplier
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Preferred Buyer Location
All over the world
Bump Test Machine is designed to conduct bump and shock tests.PC based system with NI Data Acquisition Card & LabVIEW software for Pulse capture storage and user interface.Acceleration: up to 80 g, Velocity change for Shock Bump Test: half sine pulse.Automatic Lifting and dropping of Shock Bump Platform for programmable number of cycles.