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1) Scanning tunneling microscopy-calibration and substrates
2) Graphite Monochromators
3) X-Ray diffraction
4) Neutron scattering and diffraction
HOPG is widely used as a substrate for specimens to be examined in scanning probe microscopy. It is also used as a calibration specimen and cleaves almost like mica because of its layered structure. Unlike mica, HOPG is non-polar and, for samples where elemental analysis is required, it provides a carbon-only background. It consists of highly ordered planes of carbon atoms in (002) orientation and the quality of these parallel planes is defined by the mosaic spread angle.