Atomic force microscope Application support

Listing ID #5132007

are you a scanning probe microscope user (any afm/stm instrument) and wondering how to get the best quality of images. Then you are reading the right message.

• i am a phd in afm technology with 14 years experience in this field from usa and europe.
• can provide you complete support for all your application support.
• sample preparation, high quality afm imaging.
• teaching all the various modes in afm and stm
• data analysis
• giving you complete understanding of the afm mode
• technical details of cantilevers need to be used for various experiments and so on

so if you are having any problem in using scanning probe microscopes (afm/stm) and unable to get any satisfactory data or having problem in understanding the data you got