Atomic Force Microscope

We are offering atomic force microscope.
Tight mechanical coupling yields excellent noise performance.
integrated with inverted optical microscopes.
two independent, xy and closed-loop z scanner.
flat and linear xy scan of up to 40 µm × 40 µm with low residual bow.
accurate height measurements.
less tip wear for prolonged high-quality and high-resolution imaging.
minimized sample damage or modification.
immunity from parameter-dependent results observed in tapping imaging.
easy sample or tip exchange and easy head removal.
direct on-axis optics for high resolution optical viewing.
back-lash free sample-stage. Sample positioning range of 7 mm in x and y.
compatible with both reflection and transmission optical viewing.