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For measurements of relative and absolute spectral response resp. quantum efficiency of solar cells. Spectral range 300 nm —3000 nm (or as desired), cell size up to 4 x 4 cm2 . Specialised bias light adapters for tandem cells or concentrator cells available, For the determination of solar cell parameters, s more...
For measurements of relative and absolute spectral response resp. quantum efficiency of solar cells. Spectral range 300 nm 3000 nm (or as desired), cell size up to 4 x 4 cm2 . Specialised bias light adapters for tandem cells or concentrator cells available. For the determination of solar cell parameters, such more...
HORIBA Scientific̢۪s ellipsometers incorporate non-rotating phase modulation and liquid crystal modulation technologies to provide the most sensitive and accurate ellipsometric measurement on a large spectral range from VUV to NIR. more...
Spectroscopic ellipsometer is widely used for thin film and measurements. It uses a high speed CCD array detection to collect the entire spectrum. It measures films from nanometer thickness up to tens of microns and the optical properties from transparent to absorbing materials. It accurately measures optical more...
In order to keep our offerings in safe and secure conditions, we have developed a storage unit and keep it updated with the defined industry standards. Quality raw materials have been used for the production of our entire range. As a dependable name, we procure these raw materials only from trustworthy source more...
Spectroscopic Ellipsometer SE series are advanced models built by Angstrom Sun Technologies Inc. These system have advantages over reflectometers due to its capability to acquire more set of polarization information at different incident angles spectroscopically. User can select two different data acquisition more...
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The J. A. Woollam Co. is a manufacturer of spectroscopic ellipsometers for non-destructive thin film and bulk material characterization. Spectroscopic ellipsometry (SE) has become the standard for measuring thin film thickness and optical constants (n and k). Spectroscopic ellipsometry is used for characteriz more...
All thanks to our smart inventory management owing to which safe and quick deliveries are furnished by us. As a customer-focused firm, we strive hard to delight them with high quality range of products that are the perfect outcome of premium raw material and modern work methods. more...
The J. A. Woollam Co. is a manufacturer of spectroscopic ellipsometers for non-destructive thin film and bulk material characterization. Spectroscopic ellipsometry (SE) has become the standard for measuring thin film thickness and optical constants (n and k). Spectroscopic ellipsometry is used for characteriz more...
ULVAC Incorporation
(Tarnaka,Secunderabad) - No. 301, Tara Tycoon No. 12-13-97, Tarnaka,Secunderabad
Holmarc Opto Mechatronics Private Limited
(Kalamassery,Ernakulam) - B - 7, H. M. T. Industrial Estate, H. M. T. P. O. Kalamassery,Ernakulam
Lab India Instrument Private Limited
(Udyog Vihar,Gurugram) - No. 372, Udyog Vihar, Phase 2,Gurugram
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