Fischer Measurement Technologies (India) Pvt. Ltd.

Hinjewadi, Pune, Maharashtra

Adaption to the coating and substrate material in one step using a coated reference part with a coating thickness higher than 200 m (7.87 inches). This kind of calibration supplies only a lower accuracy.

General Features

• Measuring method : Magnetic induction method (ISO 2178, ASTM D7091, Measurement of non-magnetic coatings on magnetic substrates)
• Probe:Probe tip radius : 2 mm (78 mils); Probe tip material: Hard metal
• Data memory : Max. 1, 000 individual readings; the contents of the memory is retained even without batteries
• Measuring frequency : Automatic upon placement of the probe; indication of the measurement with a beep visually with a green lit LED
• Display : Graphic display, in addition to the measurement reading the mean value and the standard deviation or the number of measurement reading can also be displayed.LCD display on the top side of the instrument, e.g., for reading the measurement value for measurement overhead
• Admissible ambient : 0+40C (+32 . +104F)
• temperature range during

Operation

• Weight (incl. batteries):MP0: 137 g (4.8 oz)
• MP0-FP: 184 g (6.5 oz)
• Power supply:2 Batteries, LR6, , 1.5 V

Applications

• Energy dispersivex-ray fluorescence measuring instrument (EDXRF) to measure thin coatings andcoating systems on very small flat structures
• Aluminum Al (13) toUranium U (92)  up to 24 elements simultaneously.
• Bench-top unit withhood opening upwards and housing with a slot on the side.
• Measuring direction: Top down
• X-Ray Source/Detection
• Standard: Micro focustube with tungsten target and beryllium window
• Three steps: 10 kV, 30kV, 50 kV
• Primaryfilter:4x changeable: Ni 10m(0.4 mils); free; Al 1000m (40 mils); Al 500m (20 mils)

Couloscope CMS2 is widely used to calculate metallic coating over the metallic as well as non metallic substrate. The range of Benchtop Unit & Measurement Unit Couloscope can measure both single and multi-layer coating. It comes with graphical display for a clear view of measurement with predefined measurement applications. The array has selectable measurement units with different display languages options like South American, Asian, and European.

Special Feature

• Assessment of measurement data in table or graphic format
• Automatic as well as manual measurement switch-off

Applications

• Multi coatings: Cr/Ni/Cu on iron
• Dual coatings: Sn/Ni on silver
• Single coatings: Zn on iron

Features

Typical fields of application of Thickness Tester MP0R FP

Gauge Types

Special Feature of Couloscope CMS Step

• Assessment of measuring data in table or graphic format
• Automatic and manual measurement switch-off

Additional for the STEP Test measurement

• Determination of the coating thicknesses as well as potential differences using the cursor
• Adjustable deplating amperage
• Automatic measurement sequence for conditioning the silver reference electrode (generation of the required AgCl coating)

Applications

• Single as well as multi coatings
• Couloscope Step Test measurement: 4-nickel-coating system on aluminum, iron, or ABS

PCB coating thickness measurement gauge - XULM PCB is engineered under the firm direction of experts. These are specific X-Ray fluorescence measuring instrument widely used for measurements and analyses of coating thicknesses and compositions on printed circuit boards. These are specific robust entry-level instrument, widely recommended by large numbers of clients.

Applications

• Measurements on small components and structures on printed circuit boards in sizes up to 610 x 610 mm (24 x 24 in)
• Measurements of functional coatings in the electronics and semiconductor industries
• Determining of the composition of electroplating baths

General Specification

• Intended use: Energy dispersive X-ray fluorescence measuring instrument (EDXRF) to determine thin coatings and alloys.
• Element range: Chlorine (17) to Uranium U (92) ⬠up to 24 elements simultaneously.
• Design: Bench-top unit with housing with a slot on the side Fixed sample support
• Measuring direction: Bottom up

Coating thickness gauge for electroplating and electroless coatings XDL is an X-ray fluorescence measuring instrument for manual or automated coating thickness measurements on protective and decorative coatings. These are extensively acknowledged as a universally applicable energy dispersive X-ray measuring instruments which are widely used for non-destructive thickness measurements and analysis of thin coatings, for measurements on mass-produced parts and printed circuit boards as well as for the solution analysis. These are engineered under the firm direction of experienced quality controllers and following international industrial standard.

Models

• XDL 210: Plane support stage, fixed Z-axis
• XDL 220: Plane support stage, motor-driven Z-axis
• XDL 230: Manually operable XY-stage, motor-driven Z-axis
• XDL 240: Motor-driven XY-stage that moves into the loading position automatically, when the protective hood is opened. Motor-driven programmable Z-axis

Applications

• Measurement of electroplated mass-produced parts
• Inspection of thin coatings, e.g., decorative chromium-plating
• Analysis of functional coatings in the electronics and semiconductor industries
• Automated measurements, e.g., on printed circuit boards
• Solution analysis in the electroplating

Coating thickness gauge for electroplating and electroless coatings XDV-µ or X-Ray Fluorescence Tester is available in various technical specifications. These are widely used for non-destructive analyses and measurements of coating thickness on very small components and structures, even with complex coating systems.

Applications

• Measurements on very small flat components and structures such as printed circuit boards, contacts or lead frames
• Analysis of very thin coatings, e.g., gold/palladium coatings of ⤠0.1 μm (0.004 mils)
• Measurement of functional coatings in the electronics and semiconductor industries
• Determination of complex multi-coating systems
• Automated measurements, e.g., in quality control

Coating thickness gauge for electroplating and electroless coatings XDLM is engineered under the firm direction of experienced quality controllers. These are widely acknowledged as X-ray fluorescence measuring instrument for manual or automated coating thickness measurements and analyses on PC-boards. These are universally applicable energy dispersive X-ray fluorescence measuring instruments and ideal for the measurement and analysis of thin coatings, even at small concentrations.

Models

• XDLM 231: Plane support stage, motor-driven Z-axis
• XDLM 232: Manually operable XY-stage, motor-driven Z-axis
• XDLM 237: Motor-driven XY-stage that moves into the loading position automatically, when the protective hood is opened. Motor-driven programmable Z-axis

Applications

• Measurement of electroplated mass-produced parts
• Inspection of thin coatings, e.g., decorative chromium-plating
• Analysis of functional coatings in the electronics and semiconductor industries
• Automated measurements, e.g., on printed circuit boards

Coating thickness measurement gauge for connectors â XULM is available in various technical specifications. These are robust entry-level X-ray fluorescence measuring instruments for non-destructive material analysis and coating thickness measurement. Compact sized these devices are extensively acclaimed for their consistent performance, outstanding accuracy and longer service life. These are widely used for the non-destructive coating thickness measurement and material analysis.

Applications

• Measurements on small parts like screws, bolts and nuts
• Measurements on contacts and electronic components
• Determining of the composition of electroplating baths

Coating thickness measurement gauge XDLM237 is engineered from the best available methods as per the national and international industrial standards. The range is available for measuring manual or automated coating thickness and analysis on electronics components, PC-boards and mass-produced parts even on small parts. Our Coating Measurement Gauge is used for the measurement and study of thin coatings.

Models

• XDLM 231: Plane support stage, motor-driven Z-axis
• XDLM 232: Manually operable XY-stage, motor-driven Z-axis
• XDLM 237: Motor-driven XY-stage that moves into the loading position mechanically, when the protective hood is opened. Motor-driven programmable Z-axis

Applications

• Measurement of electroplated mass-produced parts
• Inspection of thin coatings like decorative chromium-plating
• Analysis of functional coatings in the electronics and semiconductor industries
• Automated measurements like on printed circuit boards

General Specification

• Intended use: Energy dispersive X-ray fluorescence measuring instrument (EDXRF) to measure thin coatings and alloys.
• Element range:Aluminum Al (13) to Uranium U (92)  up to 24 elements simultaneously.
• Design:Bench-top unit with hood opening upwards XY-stage and Z-axis electrically driven and programmable
• Motor-driven changeable apertures and filters
• Video camera and laser pointer (class 1) for orienting the sample
• Measuring direction:Top down

Features of Coating Thickness Handheld Gauge

• DUPLEX measuring mode of Handheld Gauge Phascope displays paint on zinc on iron and paint on aluminum
• DUAL measuring mode for showing total thickness (paint and zinc) on iron or paint on aluminum
• Wide-ranging evaluation as well as statistics functions
• Tolerance monitoring and outlier control options
• Varied languages to choose from
• Battery and/or constant operation using plug-in charger (included)
• Storage up to 20, 000 readings
• Data transfer using RS232 interface

Probes For Coating Thickness Measurements

Typical Fields of Applications of Coating Thickness Measurements

Various measurement areas

Various measuring sites

Automated or manual measurements

Various coating hardnesses

Various coating hardnesses

Various coating hardnesses